• DocumentCode
    2173058
  • Title

    Advancing polymer process understanding in package and board applications through molecular modeling

  • Author

    Iwamoto, N.E.

  • Author_Institution
    Honeywell, San Diego, CA, USA
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    1354
  • Lastpage
    1359
  • Abstract
    In this paper we will discuss two molecular modeling methods which have been developed and applied at Honeywell to help predict material behavior from the process engineer´s standpoint. Both stress cycling and process analyses have been used to trend the probable behavior of material types in order to provide advanced intelligence on possible failure mechanisms. For instance, we have found that there are similarities in the response trends to strain and the number of cycles which suggests a link exists between the molecular-scale mechanism and engineering theories of reliability. That is, the cycling response on a molecular scale appears to be Coffin-Manson-like. On a similar scale, the molecular response of polymer chains to process stress induced either thermally or mechanically has shown to give insight to the response from actual processed parts
  • Keywords
    plastic packaging; polymers; Coffin-Manson response; circuit board; failure mechanism; molecular model; packaging; polymer; process analysis; reliability; stress cycling; Adhesives; Capacitive sensors; Failure analysis; Moisture; Packaging; Polymers; Predictive models; Reliability engineering; Reliability theory; Thermal stresses;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components & Technology Conference, 2000. 2000 Proceedings. 50th
  • Conference_Location
    Las Vegas, NV
  • Print_ISBN
    0-7803-5908-9
  • Type

    conf

  • DOI
    10.1109/ECTC.2000.853385
  • Filename
    853385