DocumentCode
2173058
Title
Advancing polymer process understanding in package and board applications through molecular modeling
Author
Iwamoto, N.E.
Author_Institution
Honeywell, San Diego, CA, USA
fYear
2000
fDate
2000
Firstpage
1354
Lastpage
1359
Abstract
In this paper we will discuss two molecular modeling methods which have been developed and applied at Honeywell to help predict material behavior from the process engineer´s standpoint. Both stress cycling and process analyses have been used to trend the probable behavior of material types in order to provide advanced intelligence on possible failure mechanisms. For instance, we have found that there are similarities in the response trends to strain and the number of cycles which suggests a link exists between the molecular-scale mechanism and engineering theories of reliability. That is, the cycling response on a molecular scale appears to be Coffin-Manson-like. On a similar scale, the molecular response of polymer chains to process stress induced either thermally or mechanically has shown to give insight to the response from actual processed parts
Keywords
plastic packaging; polymers; Coffin-Manson response; circuit board; failure mechanism; molecular model; packaging; polymer; process analysis; reliability; stress cycling; Adhesives; Capacitive sensors; Failure analysis; Moisture; Packaging; Polymers; Predictive models; Reliability engineering; Reliability theory; Thermal stresses;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components & Technology Conference, 2000. 2000 Proceedings. 50th
Conference_Location
Las Vegas, NV
Print_ISBN
0-7803-5908-9
Type
conf
DOI
10.1109/ECTC.2000.853385
Filename
853385
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