DocumentCode
2173079
Title
KAST: K-associative sector translation for NAND flash memory in real-time systems
Author
Cho, Hyunjin ; Shin, Dongkun ; Eom, Young Ik
Author_Institution
Sch. of ICE, Sungkyunkwan Univ., Suwon
fYear
2009
fDate
20-24 April 2009
Firstpage
507
Lastpage
512
Abstract
Flash memory is a good candidate for the storage device in real-time systems due to its non-fluctuating performance, low power consumption and high shock resistance. However, the garbage collection for invalid pages in flash memory can invoke a long blocking time. Moreover, the worst-case blocking time is significantly long compared to the best-case blocking time under the current flash management techniques. In this paper, we propose a novel Flash Translation Layer (FTL), called KAST, where user can configure the maximum log block associativity to control the worst-case blocking time. Performance evaluation using simulations shows that the overall performance of KAST is better than the current FTL schemes as well as KAST guarantees the longest block time is shorter than the specified value.
Keywords
NAND circuits; flash memories; low-power electronics; real-time systems; storage management; K-associative sector translation; KAST; NAND flash memory; best-case blocking time; flash management technique; flash translation layer; garbage collection; high shock resistance; low power consumption; maximum log block associativity configuration; nonfluctuating performance; real-time system; worst-case blocking time; Digital audio players; Digital cameras; Electric shock; Energy consumption; Flash memory; Fluctuations; Hard disks; Ice; Power system management; Real time systems;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation & Test in Europe Conference & Exhibition, 2009. DATE '09.
Conference_Location
Nice
ISSN
1530-1591
Print_ISBN
978-1-4244-3781-8
Type
conf
DOI
10.1109/DATE.2009.5090717
Filename
5090717
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