Title :
REX - A VLSI parasitic extraction tool for electromigration and signal analysis
Author_Institution :
Digital Equipment Corporation
Keywords :
Circuits; Data mining; Electromigration; Geometry; Layout; Parasitic capacitance; Permission; Resistors; Signal analysis; Very large scale integration;
Conference_Titel :
Design Automation Conference, 1991. 28th ACM/IEEE
Conference_Location :
IEEE
Print_ISBN :
0-89791-395-7
