DocumentCode :
2173418
Title :
Lead free solder paste flux evaluation and implementation in personal communication devices
Author :
Butterfield, Andrew ; Visintainer, Valerie ; Goudarzi, Vahid
Author_Institution :
Motorola, Plantation, FL, USA
fYear :
2000
fDate :
2000
Firstpage :
1420
Lastpage :
1425
Abstract :
This paper outlines the printing and wetting experimentation and the findings of a lead free solder paste comparison, and identifies one flux vehicle capable of performing across a wide temperature range of reflow profiles. The study included a lead free alloy using three different flux vehicles. The test boards used were a copper surface finish with organic surface protection (OSP) and Ni-Au. The goal was to understand the printing performance over time and the effect of time above liquidus and peak temperatures on the wetting characteristics for each solder paste in an air and nitrogen reflow atmosphere. The volumetric data from the printing experiment revealed little difference between the pastes and determined that the wetting characteristics would carry the most weight for the decision of a lead free solder paste. The wetting results clearly showed that only one of the solders used performed well in all the reflow profiles tested, while the others exhibited wetting problems in air as the volume of printed solder decreased. The identification of one flux vehicle allowed for the manufacturing process to be optimized, and shared with other sites globally
Keywords :
environmental factors; mobile communication; reflow soldering; wetting; Cu; Ni-Au; copper surface finish; flux vehicle; lead-free solder paste; manufacturing process; organic surface protection; personal communication device; printing; reflow profile; wetting; Copper; Environmentally friendly manufacturing techniques; Lead; Nitrogen; Printing; Protection; Surface finishing; Temperature distribution; Testing; Vehicles;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components & Technology Conference, 2000. 2000 Proceedings. 50th
Conference_Location :
Las Vegas, NV
Print_ISBN :
0-7803-5908-9
Type :
conf
DOI :
10.1109/ECTC.2000.853397
Filename :
853397
Link To Document :
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