DocumentCode :
2173519
Title :
Characterization of the melting and wetting of Sn-Ag-X solders
Author :
Bradley, Edwin, III ; Hramisavljevic, J.
Author_Institution :
Commun. Enterprise, Motorola, Plantation, FL, USA
fYear :
2000
fDate :
2000
Firstpage :
1443
Lastpage :
1448
Abstract :
There is tremendous interest presently with Pb-free solder assembly in the surface mount assembly industry in response to recent Japanese and European initiatives and proposed governmental restrictions regarding Pb usage and disposal. Many different solder alloys have been proposed as potential Pb-free solder replacements and the most promising of these fall into the general alloy families of Tin-silver (Sn-Ag), Tin-silver-copper (Sn-Ag-Cu) and Tin-silver-bismuth (Sn-Ag-Bi). Published melting point data on some of these alloys indicates that they should be capable of reduced reflow temperatures relative to the commonly available Sn-Ag alloy, which melts at 221°C. Differential Scanning Calorimetry (DSC) and reflow visualization was used to characterize the melting and wetting of the Pb-free alloys and generate the practical reflow temperature requirements. This was compared to the DSC data to gain insight on the meaning of the DSC melting data for surface mount applications. The results show that, in general, the wetting performance of the Sn-Ag-Bi alloys are more similar to Sn-Ag and Sn-Ag-Cu than would be predicted by the major onset melting temperature data as measured by the DSC
Keywords :
differential scanning calorimetry; environmental factors; melting; reflow soldering; silver alloys; surface mount technology; tin alloys; wetting; Sn-Ag; Sn-Ag-Bi; Sn-Ag-Cu; differential scanning calorimetry; lead-free solder; melting; reflow soldering; surface mount assembly; wetting; Assembly; Calorimetry; Communication industry; Costs; Drives; Lead; Phase change materials; Soldering; Temperature measurement; Temperature sensors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components & Technology Conference, 2000. 2000 Proceedings. 50th
Conference_Location :
Las Vegas, NV
Print_ISBN :
0-7803-5908-9
Type :
conf
DOI :
10.1109/ECTC.2000.853400
Filename :
853400
Link To Document :
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