Title :
Bessel-type interference patterns detected in single photon regime
Author :
Grunwald, R. ; Bock, M.
Author_Institution :
Max-Born-Inst. for Nonlinear Opt. & Ultrafast Spectrosc., Berlin
Abstract :
In this experiment, pseudonondiffracting Bessel-like intensity distributions were generated by refractive axicons at extremely weak illumination and detected by an electron multiplication CCD (EMCCD) camera (iXon, Andor) without an image intensifier. The successive growth of Bessel-like interference fringes from noise can clearly be recognized without image processing. The results of the interference experiment confirm the non-local quantum mechanical nature of single photon diffraction. In contrast to the Young´s setup with a diffracting double slit, the interference from refracted beams was observed in the near-field instead of the far field.
Keywords :
CCD image sensors; laser beams; light diffraction; light interference; quantum optics; Bessel-type interference fringe patterns; EMCCD camera; Young´s setup; diffracting double slit; diode laser light source; electron multiplication CCD; extremely weak illumination condition; nonlocal quantum mechanical nature; photon diffraction; pseudonondiffracting Bessel-like intensity distributions; refracted beam interference; refractive axicons; single photon regime; Charge coupled devices; Charge-coupled image sensors; Diffraction; Electrons; Image intensifiers; Image processing; Image recognition; Interference; Lighting; Optical refraction;
Conference_Titel :
Lasers and Electro-Optics, 2007 and the International Quantum Electronics Conference. CLEOE-IQEC 2007. European Conference on
Conference_Location :
Munich
Print_ISBN :
978-1-4244-0931-0
Electronic_ISBN :
978-1-4244-0931-0
DOI :
10.1109/CLEOE-IQEC.2007.4386886
