Title :
Design of compact imperfection-immune CNFET layouts for standard-cell-based logic synthesis
Author :
Bobba, Shashikanth ; Zhang, Jie ; Pullini, Antonio ; Atienza, David ; De Micheli, Giovanni
Author_Institution :
LSI, EPFL, Lausanne
Abstract :
The quest for technologies with superior device characteristics has showcased carbon nanotube field effect transistors (CNFETs) into limelight. Among the several design aspects necessary for today´s grail in CNFET technology, achieving functional immunity to carbon nanotube (CNT) manufacturing issues (such as mispositioned CNTs and metallic CNTs) is of paramount importance. In this work we present a new design technique to build compact layouts while ensuring 100% functional immunity to mispositioned CNTs. Then, as second contribution of this work, we have developed a CNFET design kit (DK) to realize a complete design flow from logic-to-GDSII traversing the conventional CMOS design flow. This flow enables a framework that allows accurate comparison between CMOS and CNFET-based circuits. This paper also presents simulation results to illustrate such analysis, namely, a CNFET-based inverter can achieve gains, with respect to the energy-delay product (EDP) metric, of more than 4times in delay, 2times in energy/cycle and significant area savings (more than 30%) when compared to a corresponding CMOS inverter benchmarked with an industrial 65 nm technology.
Keywords :
CMOS logic circuits; carbon nanotubes; cellular arrays; field effect transistors; CMOS inverter; CNFET design kit; carbon nanotube field effect transistors; compact imperfection-immune CNFET layouts; energy-delay product; standard-cell-based logic synthesis; Analytical models; CMOS technology; CNTFETs; Carbon nanotubes; Circuit simulation; Delay; Inverters; Logic design; Logic devices; Manufacturing; CNFET; CNT; Carbon Nanotube Transistors; Imperfection Immune; Logic Synthesis; Misaligned Immune;
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition, 2009. DATE '09.
Conference_Location :
Nice
Print_ISBN :
978-1-4244-3781-8
DOI :
10.1109/DATE.2009.5090741