DocumentCode
2173652
Title
Design of compact imperfection-immune CNFET layouts for standard-cell-based logic synthesis
Author
Bobba, Shashikanth ; Zhang, Jie ; Pullini, Antonio ; Atienza, David ; De Micheli, Giovanni
Author_Institution
LSI, EPFL, Lausanne
fYear
2009
fDate
20-24 April 2009
Firstpage
616
Lastpage
621
Abstract
The quest for technologies with superior device characteristics has showcased carbon nanotube field effect transistors (CNFETs) into limelight. Among the several design aspects necessary for today´s grail in CNFET technology, achieving functional immunity to carbon nanotube (CNT) manufacturing issues (such as mispositioned CNTs and metallic CNTs) is of paramount importance. In this work we present a new design technique to build compact layouts while ensuring 100% functional immunity to mispositioned CNTs. Then, as second contribution of this work, we have developed a CNFET design kit (DK) to realize a complete design flow from logic-to-GDSII traversing the conventional CMOS design flow. This flow enables a framework that allows accurate comparison between CMOS and CNFET-based circuits. This paper also presents simulation results to illustrate such analysis, namely, a CNFET-based inverter can achieve gains, with respect to the energy-delay product (EDP) metric, of more than 4times in delay, 2times in energy/cycle and significant area savings (more than 30%) when compared to a corresponding CMOS inverter benchmarked with an industrial 65 nm technology.
Keywords
CMOS logic circuits; carbon nanotubes; cellular arrays; field effect transistors; CMOS inverter; CNFET design kit; carbon nanotube field effect transistors; compact imperfection-immune CNFET layouts; energy-delay product; standard-cell-based logic synthesis; Analytical models; CMOS technology; CNTFETs; Carbon nanotubes; Circuit simulation; Delay; Inverters; Logic design; Logic devices; Manufacturing; CNFET; CNT; Carbon Nanotube Transistors; Imperfection Immune; Logic Synthesis; Misaligned Immune;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation & Test in Europe Conference & Exhibition, 2009. DATE '09.
Conference_Location
Nice
ISSN
1530-1591
Print_ISBN
978-1-4244-3781-8
Type
conf
DOI
10.1109/DATE.2009.5090741
Filename
5090741
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