Title :
Study on the reliability of DC/DC converter in CETRM test
Author :
Weidong, Ma ; Min, Guo ; Xielei, Meng ; Changzhi, Lv ; Xuesong, Xie ; Xiaoling, Zhang ; Li Ying
Author_Institution :
Coll. of Electron. Inf. & Control Eng., Beijing Univ. of Technol., Beijing, China
Abstract :
With the development of manufacturing technology and process level, the reliability of DC/DC converter becomes higher and higher, which is a big challenge to the reliability evaluation of DC/DC converter. In this paper, to solve the problem, DC/DC converter is studied by the test of constant electrical stress and temperature ramp stress method (CETRM). With CETRM, time and cost of the test are efficiently reduced. Ten DC/DC converters are tested using CETRM. Failure sensitive parameter, activation energy, failure temperature, failure rate, lifetime and failure rate are acquired, which testifies the application and efficiency of CETRM for DC/DC converter proposed in this paper.
Keywords :
DC-DC power convertors; power system reliability; CETRM test; DC/DC converter reliability; activation energy; constant electrical stress test; failure rate; failure sensitive parameter; failure temperature; temperature ramp stress test; DC-DC power converters; Degradation; Life estimation; Mathematical model; Multichip modules; Reliability; Stress; DC/DC converter; constant electrical stress and temperature ramp stress method (CETRM); lifetime; reliability;
Conference_Titel :
Electronics, Communications and Control (ICECC), 2011 International Conference on
Conference_Location :
Ningbo
Print_ISBN :
978-1-4577-0320-1
DOI :
10.1109/ICECC.2011.6066490
