DocumentCode :
2173835
Title :
Caspar: Hardware patching for multicore processors
Author :
Wagner, Ilya ; Bertacco, Valeria
Author_Institution :
Univ. of Michigan, Ann Arbor, MI
fYear :
2009
fDate :
20-24 April 2009
Firstpage :
658
Lastpage :
663
Abstract :
Ensuring correctness of execution of complex multi-core processor systems deployed in the field remains to this day an extremely challenging task. The major part of this effort is concentrated on design verification, where different pre- and post-silicon techniques are used to guarantee that devices behave exactly as stated in the specification. Unfortunately, the performance of even state-of-the-art validation tools lags behind the growing complexity of multi-core designs. Therefore, subtle bugs still slip into released components, causing incorrect computational results, or even compromising the security of the end-user systems. In this work we present Caspar - an approach for in-the-field patching of the memory subsystem hardware in multi-core chips. Caspar relies on a checkpointing system, which periodically logs the state of the chip, and a novel error detection and recovery scheme, which uses a simplified mode of operation to bypass cache coherence and consistency errors. The implementation of Caspar employs hardware detectors: on-die programmable circuits to identify system´s configurations that may lead to bugs, and to trigger recovery and bypass. Our experimental results show that Caspar can be used effectively to detect and bypass a variety of memory subsystem bugs, with as little as 2% performance impact and 6% area overhead during bug-free operation.
Keywords :
hardware-software codesign; microprocessor chips; Caspar; bug-free operation; checkpointing system; design verification; end-user systems; hardware patching; in-the-field patching; memory subsystem hardware; multicore processors; Checkpointing; Coherence; Computer bugs; Detectors; Hardware; Multicore processing; Programmable circuits; Protocols; Runtime; Security;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition, 2009. DATE '09.
Conference_Location :
Nice
ISSN :
1530-1591
Print_ISBN :
978-1-4244-3781-8
Type :
conf
DOI :
10.1109/DATE.2009.5090748
Filename :
5090748
Link To Document :
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