Title :
Metastability of SOI CMOS latches
Author :
Tretz, C. ; Chuang, C.T. ; Terman, L.M. ; Anderson, C.J. ; Zukowski, C.
Author_Institution :
Dept. of Electr. Eng., Columbia Univ., New York, NY, USA
Abstract :
SOI has recently emerged as a serious contender for low-power high-performance applications. This paper examines the metastability of CMOS latches based on partially-depleted (PD) SOI devices with various body-connection topologies
Keywords :
CMOS logic circuits; circuit stability; flip-flops; silicon-on-insulator; SOI CMOS latch; body-connection topology; low-power circuit; metastability; partially-depleted SOI device; Clamps; Clocks; Diodes; MOSFET circuits; Metastasis; Power supplies; Rails; Switches; Topology; Voltage;
Conference_Titel :
SOI Conference, 1997. Proceedings., 1997 IEEE International
Conference_Location :
Fish Camp, CA
Print_ISBN :
0-7803-3938-X
DOI :
10.1109/SOI.1997.634983
