Title :
The simultaneous use of three machine speech recognition systems to increase recognition accuracy
Author :
Barry, Tim ; Solz, Tom ; Reising, John ; Williamson, Dave
Author_Institution :
North Coast Simulation, Dayton, OH, USA
Abstract :
Two studies were performed to test the ability of three different automated speech recognition devices working in parallel, along with an Enhanced Majority Rules (EMR) software algorithm, to obtain a combined speech recognition accuracy better than the accuracies produced by each of the individual systems alone. The first experiment, using a rather simple, robust vocabulary, compared the recognition accuracy of the three individual systems with the accuracy obtained by combining the data from all three systems using the EMR algorithm. The second experiment made the same comparison, but a more difficult, non-robust vocabulary was used during testing. Results from both experiments revealed a significant increase in speech recognition accuracy obtained by combining the recognition data from all three systems in the EMR algorithm when compared with two of the three speech recognition systems. The third system, a newer-generation recognition device, performed as well as all three used in concert. The implications of using intelligent software and multiple speech recognition devices to improve speech recognition accuracy are discussed
Keywords :
aerospace computing; aircraft instrumentation; military computing; parallel processing; speech analysis and processing; speech recognition; speech recognition equipment; user interfaces; automated speech recognition; avionics; cockpit natural language; enhanced majority rules software algorithm; intelligent software; military environment; multiple speech recognition devices; parallel processing; pilot workload alleviation; recognition accuracy; speech recognition systems; Aerospace electronics; Aircraft navigation; Automatic speech recognition; Communication system control; Master-slave; Performance evaluation; Speech enhancement; Speech recognition; Testing; Vocabulary;
Conference_Titel :
Aerospace and Electronics Conference, 1994. NAECON 1994., Proceedings of the IEEE 1994 National
Conference_Location :
Dayton, OH
Print_ISBN :
0-7803-1893-5
DOI :
10.1109/NAECON.1994.332846