Title :
Package routability- and IR-drop-aware finger/pad assignment in chip-package co-design
Author :
Lu, Chao-Hung ; Chen, Hung-Ming ; Liu, Chien-Nan Jimmy ; Shih, Wen-Yu
Author_Institution :
Dept. of Electr. Eng., Nat. Central Univ., Taoyuan
Abstract :
Due to increasing complexity of design interactions between the chip, package and PCB, it is essential to consider them at the same time. Specifically the finger/pad locations affect the performance of the chip and the package significantly. In this paper, we have developed techniques in chip-package codesign to decide the locations of fingers/pads for package routability and signal integrity concerns in chip core design. Our finger/pad assignment is a two-step method: first we optimize the wire congestion problem in package routing, and then we try to minimize the IR-drop violation with finger/pad solution refinement. The experimental results are encouraging. Compared with the randomly optimized methods, our approaches reduce in average 42% and 68% of the maximum density in package and 10.61% of IR-drop for test circuits.
Keywords :
chip scale packaging; integrated circuit design; integrated circuit testing; printed circuits; IR-drop-aware finger-pad assignment; PCB; chip core design; chip-package co-design; finger-pad location; finger-pad solution refinement; package routability; signal integrity; Chaos; Chip scale packaging; Circuit testing; Design engineering; Electronics packaging; Fingers; Flowcharts; Noise reduction; Optimization methods; Routing;
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition, 2009. DATE '09.
Conference_Location :
Nice
Print_ISBN :
978-1-4244-3781-8
DOI :
10.1109/DATE.2009.5090780