• DocumentCode
    2175026
  • Title

    Single ended 6T SRAM with isolated read-port for low-power embedded systems

  • Author

    Singh, Jawar ; Pradhan, Dhiraj K. ; Hollis, Simon ; Mohanty, Saraju P. ; Mathew, J.

  • Author_Institution
    Dept. of Comput. Sci., Univ. of Bristol, Bristol
  • fYear
    2009
  • fDate
    20-24 April 2009
  • Firstpage
    917
  • Lastpage
    922
  • Abstract
    This paper presents a six-transistor (6T) single-ended static random access memory (SE-SRAM) bitcell with an isolated read-port, suitable for low-VDD and low-power embedded applications. The proposed bitcell has a better static noise margin (SNM) and write-ability compared to a standard 6T bitcell and equivalent to an 8T bitcell [1]. An 8Kbit SRAM module with the proposed and standard 6T bitcells is simulated, including full blown parasitics using BPTM, 65 nm CMOS technology node to evaluate and compare different performance parameters. The active power dissipation in the proposed 6T design is 28% and 25% less, compared to standard 6T and 8T SRAM modules respectively.
  • Keywords
    CMOS memory circuits; SRAM chips; embedded systems; transistor circuits; CMOS technology; SRAM module; active power dissipation; isolated read-port; memory size 8 KByte; parasitics; six-transistor single- ended static random access memory bitcell; size 65 nm; static noise margin; Batteries; CMOS technology; Capacitance; Computer science; Embedded system; Energy consumption; Inverters; Random access memory; Stability; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation & Test in Europe Conference & Exhibition, 2009. DATE '09.
  • Conference_Location
    Nice
  • ISSN
    1530-1591
  • Print_ISBN
    978-1-4244-3781-8
  • Type

    conf

  • DOI
    10.1109/DATE.2009.5090796
  • Filename
    5090796