DocumentCode
2175026
Title
Single ended 6T SRAM with isolated read-port for low-power embedded systems
Author
Singh, Jawar ; Pradhan, Dhiraj K. ; Hollis, Simon ; Mohanty, Saraju P. ; Mathew, J.
Author_Institution
Dept. of Comput. Sci., Univ. of Bristol, Bristol
fYear
2009
fDate
20-24 April 2009
Firstpage
917
Lastpage
922
Abstract
This paper presents a six-transistor (6T) single-ended static random access memory (SE-SRAM) bitcell with an isolated read-port, suitable for low-VDD and low-power embedded applications. The proposed bitcell has a better static noise margin (SNM) and write-ability compared to a standard 6T bitcell and equivalent to an 8T bitcell [1]. An 8Kbit SRAM module with the proposed and standard 6T bitcells is simulated, including full blown parasitics using BPTM, 65 nm CMOS technology node to evaluate and compare different performance parameters. The active power dissipation in the proposed 6T design is 28% and 25% less, compared to standard 6T and 8T SRAM modules respectively.
Keywords
CMOS memory circuits; SRAM chips; embedded systems; transistor circuits; CMOS technology; SRAM module; active power dissipation; isolated read-port; memory size 8 KByte; parasitics; six-transistor single- ended static random access memory bitcell; size 65 nm; static noise margin; Batteries; CMOS technology; Capacitance; Computer science; Embedded system; Energy consumption; Inverters; Random access memory; Stability; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation & Test in Europe Conference & Exhibition, 2009. DATE '09.
Conference_Location
Nice
ISSN
1530-1591
Print_ISBN
978-1-4244-3781-8
Type
conf
DOI
10.1109/DATE.2009.5090796
Filename
5090796
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