DocumentCode :
2175284
Title :
Fabrication of a p-type Sb2Te3 and n-type Bi 2Te3 thin film thermocouple
Author :
Zou, Helin ; Rowe, D.M. ; Williams, S.G.K.
Author_Institution :
Sch. of Eng., Cardiff Univ., UK
fYear :
2001
fDate :
2001
Firstpage :
314
Lastpage :
317
Abstract :
A thin film Sb2Te3-Bi2Te3 based thermocouple was fabricated. P-type antimony telluride thin films and n-type bismuth telluride thin films have been deposited by co-evaporation on to glass substrates. The conditions for deposition have been investigated as a function of substrate temperature (Ts ) and flux ratio (Fr = F(Te)/F(Sb,Bi)) and optimised to achieve a high thermoelectric power factor. The qualities of deposited films, e.g. structure, composition and morphology, have been examined by X-ray diffraction (XRD), energy dispersive X-ray analysis (EDXA), flame atomic absorption spectroscopy (FAAS) and atomic force microscope (AFM). The thermoelectric properties of the thin films have been studied by room temperature measurement of the Seebeck coefficient, Hall coefficient and electrical resistivity. It has been observed that the Seebeck coefficient and electrical conductivity of p-type Sb2Te3 thin film (αp, σp) and n-type Bi2Te3 thin films (αn, σn) were found to be about 185 μV/K, 0.32 × 103 Ω-1 cm-1 and -228 μV/K, 0.77 × 103 Ω -1 cm-1, respectively. From optimal deposition parameters, a thin film thermocouple was fabricated and operated in Peltier mode. The observed maximum value for temperature difference between hot and cold end is about 15 K for a current of 50 mA. The results indicate that good quality antimony telluride and bismuth telluride thin films grown by co-evaporation are promising candidates for use in a micro-Peltier module
Keywords :
Hall effect; Peltier effect; X-ray diffraction; antimony compounds; bismuth compounds; electrical conductivity; semiconductor growth; semiconductor materials; semiconductor thin films; thermocouples; thermoelectric power; vacuum deposition; 300 K; 50 mA; AFM; EDXA; FAAS; Hall coefficient; Peltier mode; Sb2Te3-Bi2Te3; Seebeck coefficient; X-ray diffraction; XRD; atomic force microscopy; co-evaporation deposition; deposition conditions; electrical resistivity; energy dispersive X-ray analysis; film composition; film morphology; film structure; flame atomic absorption spectroscopy; flux ratio; micro-Peltier module; n-type Bi2Te3; p-type Sb2Te3; substrate temperature; thermoelectric power factor; thin film Sb2Te3-Bi2Te3 based thermocouple; Atomic layer deposition; Atomic measurements; Bismuth; Fabrication; Sputtering; Substrates; Tellurium; Temperature; Thermoelectricity; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermoelectrics, 2001. Proceedings ICT 2001. XX International Conference on
Conference_Location :
Beijing
ISSN :
1094-2734
Print_ISBN :
0-7803-7205-0
Type :
conf
DOI :
10.1109/ICT.2001.979895
Filename :
979895
Link To Document :
بازگشت