Title :
Characterization of cross-plane thermoelectric properties of Si/Ge superlattices
Author :
Bao Yang ; Liu, Jianlin ; Wang, Kang ; Chen, Gang
Author_Institution :
Dept. of Mech. & Aerosp. Eng., California Univ., Los Angeles, CA, USA
Abstract :
In this paper, a novel method is developed to measure simultaneously the Seebeck coefficient and thermal conductivity in the cross-plane direction of thin films. Using a differential measurement between a superlattice sample and a reference sample, the temperature and voltage drops cross the superlattice thin film are determined and used to deduce its cross plane thermal conductivity and Seebeck coefficient
Keywords :
Seebeck effect; elemental semiconductors; germanium; semiconductor superlattices; silicon; thermal conductivity; thermoelectricity; Seebeck coefficient; Si-Ge; Si/Ge superlattices; cross-plane thermoelectric properties; thermal conductivity; Conductivity measurement; Electrons; Frequency; Laser sintering; Phonons; Semiconductor superlattices; Thermal conductivity; Thermoelectricity; Transistors; Voltage;
Conference_Titel :
Thermoelectrics, 2001. Proceedings ICT 2001. XX International Conference on
Conference_Location :
Beijing
Print_ISBN :
0-7803-7205-0
DOI :
10.1109/ICT.2001.979902
