DocumentCode :
2176275
Title :
Efficient compression and handling of current source model library waveforms
Author :
Hatami, Safar ; Feldmann, Peter ; Abbaspour, Soroush ; Pedram, Massoud
Author_Institution :
Dept. of Electr. Eng., Univ. of Southern California, Los Angeles, CA
fYear :
2009
fDate :
20-24 April 2009
Firstpage :
1178
Lastpage :
1183
Abstract :
This paper describes a waveform compression technique suitable for the efficient utilization, storage and interchange of the emerging current source model (CSM) based cell libraries. The technique is based on pre-processing of a collection of voltage/current waveforms for the cells in the library and then, constructing an orthogonal time-voltage/time-current waveform basis using singular-value decomposition. Compression is achieved by representing all waveforms as linear combination coefficients of adaptive subset of the basis waveforms. Experimental results indicate that adaptive waveform representation results in higher compression ratios than the waveform representation as a function of fixed set of basis functions. Interpolation and further compression are obtained by representing the coefficients as simple functions of various parameters, e.g., input slew, load capacitance, supply voltage, and temperature. The methods introduced in this paper are tested and validated on several industrial strength libraries, with spectacular compression results.
Keywords :
CMOS integrated circuits; interpolation; singular value decomposition; waveform analysis; CSM cell library; current source model library waveforms; input slew; linear combination coefficients; load capacitance; singular value decomposition; supply voltage; time voltage-time current waveform basis; waveform compression technique; CMOS technology; Capacitance; Interpolation; Libraries; Power system modeling; Semiconductor device modeling; Space technology; Temperature; Timing; Voltage; Adaptive Data Compression; Current Source Model; Parameterization; Pre-processing; Principal Component;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition, 2009. DATE '09.
Conference_Location :
Nice
ISSN :
1530-1591
Print_ISBN :
978-1-4244-3781-8
Type :
conf
DOI :
10.1109/DATE.2009.5090841
Filename :
5090841
Link To Document :
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