DocumentCode
2176275
Title
Efficient compression and handling of current source model library waveforms
Author
Hatami, Safar ; Feldmann, Peter ; Abbaspour, Soroush ; Pedram, Massoud
Author_Institution
Dept. of Electr. Eng., Univ. of Southern California, Los Angeles, CA
fYear
2009
fDate
20-24 April 2009
Firstpage
1178
Lastpage
1183
Abstract
This paper describes a waveform compression technique suitable for the efficient utilization, storage and interchange of the emerging current source model (CSM) based cell libraries. The technique is based on pre-processing of a collection of voltage/current waveforms for the cells in the library and then, constructing an orthogonal time-voltage/time-current waveform basis using singular-value decomposition. Compression is achieved by representing all waveforms as linear combination coefficients of adaptive subset of the basis waveforms. Experimental results indicate that adaptive waveform representation results in higher compression ratios than the waveform representation as a function of fixed set of basis functions. Interpolation and further compression are obtained by representing the coefficients as simple functions of various parameters, e.g., input slew, load capacitance, supply voltage, and temperature. The methods introduced in this paper are tested and validated on several industrial strength libraries, with spectacular compression results.
Keywords
CMOS integrated circuits; interpolation; singular value decomposition; waveform analysis; CSM cell library; current source model library waveforms; input slew; linear combination coefficients; load capacitance; singular value decomposition; supply voltage; time voltage-time current waveform basis; waveform compression technique; CMOS technology; Capacitance; Interpolation; Libraries; Power system modeling; Semiconductor device modeling; Space technology; Temperature; Timing; Voltage; Adaptive Data Compression; Current Source Model; Parameterization; Pre-processing; Principal Component;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation & Test in Europe Conference & Exhibition, 2009. DATE '09.
Conference_Location
Nice
ISSN
1530-1591
Print_ISBN
978-1-4244-3781-8
Type
conf
DOI
10.1109/DATE.2009.5090841
Filename
5090841
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