• DocumentCode
    2176543
  • Title

    Investigation of an embedded RF switch IC in printed-circuit-board

  • Author

    Ryu, Jong-In ; Kim, Dongsu ; Park, Se-Hoon ; Park, Jong Chul ; Kim, Jun Chul

  • Author_Institution
    Korea Electron. Technol. Inst., Seongnam, South Korea
  • fYear
    2008
  • fDate
    10-12 Dec. 2008
  • Firstpage
    81
  • Lastpage
    84
  • Abstract
    This paper presents the interconnection performance of the embedded integrated-circuit (IC) in printed-circuit-board (PCB) against wire-bonding method. Embedding IC into PCB substrate, micro-vias were adopted to interconnect the IC to the substrate. In order to consider the RF performance of the interconnection used for embedding IC into the PCB substrate, a double-pole-double-through (DPDT) switch IC was selected as an embedded RF IC. The insertion loss (IL) and the return loss (RL) of each switch were measured in order to compare the wire-bonded switch IC to the embedded switch IC. As a result, the wire-bonded switch IL is better than 0.7 dB and the RL is 16.2 dB at 5 GHz. The embedded switch IL is 0.6 dB and the RL is greater than 33.5 dB at 5 GHz. In addition to this, the embedded switch RL is better than 25 dB until 7 GHz. Thus the micro-via interconnection of the embedded switch in PCB substrate demonstrated better the RF performance than wire-bonding method in perspectives of the RL and the IL. This paper presents the advantages of the embedded IC in PCB by using micro-via.
  • Keywords
    integrated circuit interconnections; lead bonding; printed circuits; substrates; switches; double-pole-double-through switch IC; embedded RF switch IC; frequency 5 GHz; gain 0.6 dB; gain 0.7 dB; gain 16.2 dB; gain 33.5 dB; insertion loss; interconnection performance; printed-circuit-board; return loss; substrate; wire-bonding method; Impedance; Insertion loss; Loss measurement; Packaging; Performance loss; Radio frequency; Radiofrequency integrated circuits; Shape; Switches; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Packaging and Systems Symposium, 2008. EDAPS 2008. Electrical Design of
  • Conference_Location
    Seoul
  • Print_ISBN
    978-1-4244-2633-1
  • Electronic_ISBN
    978-1-4244-2634-8
  • Type

    conf

  • DOI
    10.1109/EDAPS.2008.4736004
  • Filename
    4736004