Broadband Near-field Optical Spectrometer for the Observation of Structural Phase Contrast in Organic Semiconductors

Author

Polli, D. ; Pomraenke, R. ; Ropers, C. ; Renard, J. ; Lüer, L. ; Cerullo, G. ; Lienau, C.

Author_Institution

Dipt. di Fis., Politec. di Milano, Milan

fYear

2007

fDate

17-22 June 2007

Firstpage

1

Lastpage

1

Abstract

A home-built near-field spectrometer based on an aperture near-field scanning optical microscope coupled to an ultrabroadband laser is reported. The NSOM spectrometer is used to image amorphous TiOPc thin films consisting of nanocrystallites interfaced by amorphous regions. Observations show absorption spectra averaged over the 700-750 nm and 820-900 nm wavelength regions.

Keywords

amorphous semiconductors; crystallites; infrared spectra; nanostructured materials; near-field scanning optical microscopy; organic semiconductors; semiconductor thin films; NSOM; absorption spectra; amorphous TiOPc thin films; aperture near-field scanning optical microscope; broadband near-field optical spectrometer; nanocrystallites; organic semiconductors; structural phase contrast; ultrabroadband laser; wavelength 700 nm to 750 nm; wavelength 820 nm to 900 nm; Absorption; Amorphous materials; Apertures; Optical coupling; Optical films; Optical microscopy; Organic semiconductors; Semiconductor lasers; Semiconductor thin films; Spectroscopy;

fLanguage

English

Publisher

ieee

Conference_Titel

Lasers and Electro-Optics, 2007 and the International Quantum Electronics Conference. CLEOE-IQEC 2007. European Conference on

Conference_Location

Munich

Print_ISBN

978-1-4244-0930-3

Electronic_ISBN

978-1-4244-0931-0

Type

conf

DOI

10.1109/CLEOE-IQEC.2007.4387032

Filename

4387032