DocumentCode
2177075
Title
Conceptual design of test aides for flight critical control systems
Author
Houchard, Jack H.
Author_Institution
Frontier Technol. Inc., Beavercreek, OH, USA
fYear
1994
fDate
23-27 May 1994
Firstpage
911
Abstract
This paper describes the conceptual design of a suite of tools that will aid and/or automate various aspects of the control system verification and validation process. The suite provides for the definition of system data, generation of test procedures, and semi-automated test execution and evaluation. One element of this long-range vision, the Test Procedure Generator, is in the early stages of development under NASA´s Small Business Innovative Research program. The TPG supports testing at the component, subsystem and complete system levels. It accepts system design data, including component and interface layout, as well as detailed component behavioral specifications defined using functional block diagrams. The TPG allows identification of the system elements to test and the specific interfaces to stimulate and/or monitor. The TPG aids the test engineer by suggesting tests to perform and generating detailed test procedures in a language suitable for automated test implementation
Keywords
aerospace computer control; aerospace computing; automatic programming; fault tolerant computing; program interpreters; program testing; program verification; programming environments; NASA; Test Procedure Generator; automated test implementation; behavioral specifications; flight critical control; identification; integrated test aides; long-range vision; semiautomated test execution; site specific translator; system test environment; test aides; test procedure generator; Aerospace engineering; Aerospace testing; Automatic control; Automatic testing; Computer interfaces; Control systems; Performance evaluation; Power generation; System testing; Vehicles;
fLanguage
English
Publisher
ieee
Conference_Titel
Aerospace and Electronics Conference, 1994. NAECON 1994., Proceedings of the IEEE 1994 National
Conference_Location
Dayton, OH
Print_ISBN
0-7803-1893-5
Type
conf
DOI
10.1109/NAECON.1994.332943
Filename
332943
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