• DocumentCode
    2177075
  • Title

    Conceptual design of test aides for flight critical control systems

  • Author

    Houchard, Jack H.

  • Author_Institution
    Frontier Technol. Inc., Beavercreek, OH, USA
  • fYear
    1994
  • fDate
    23-27 May 1994
  • Firstpage
    911
  • Abstract
    This paper describes the conceptual design of a suite of tools that will aid and/or automate various aspects of the control system verification and validation process. The suite provides for the definition of system data, generation of test procedures, and semi-automated test execution and evaluation. One element of this long-range vision, the Test Procedure Generator, is in the early stages of development under NASA´s Small Business Innovative Research program. The TPG supports testing at the component, subsystem and complete system levels. It accepts system design data, including component and interface layout, as well as detailed component behavioral specifications defined using functional block diagrams. The TPG allows identification of the system elements to test and the specific interfaces to stimulate and/or monitor. The TPG aids the test engineer by suggesting tests to perform and generating detailed test procedures in a language suitable for automated test implementation
  • Keywords
    aerospace computer control; aerospace computing; automatic programming; fault tolerant computing; program interpreters; program testing; program verification; programming environments; NASA; Test Procedure Generator; automated test implementation; behavioral specifications; flight critical control; identification; integrated test aides; long-range vision; semiautomated test execution; site specific translator; system test environment; test aides; test procedure generator; Aerospace engineering; Aerospace testing; Automatic control; Automatic testing; Computer interfaces; Control systems; Performance evaluation; Power generation; System testing; Vehicles;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Aerospace and Electronics Conference, 1994. NAECON 1994., Proceedings of the IEEE 1994 National
  • Conference_Location
    Dayton, OH
  • Print_ISBN
    0-7803-1893-5
  • Type

    conf

  • DOI
    10.1109/NAECON.1994.332943
  • Filename
    332943