Visualization of surface charge distribution on insulating films using spatial optical phase modulation system

Author

Kawasaki, T. ; Terashima, T. ; Takada, T. ; Maeno, T.

Author_Institution

Lab. of Electron. Meas., Musashi Inst. of Technol., Tokyo, Japan

Volume

2

fYear

1994

fDate

3-8 Jul 1994

Firstpage

682

Abstract

A visualization and a quantification technique of a latent electric charge image on a dielectric material has been developed by using Pockels effect and a computer image processing. An optical phase modulation technique and computer image lock-in amplifier processing were used to improve the signal to noise ratio. The measurement system has several improved performances: a sensitivity of surface charge of 1 nC cm^-2; a spatial resolution of 200 μm; and discrimination of the charge polarity. The basic principle of advanced electrooptic surface charge measurement is described and the typical surface charge distribution of a positive discharge streamer produced by an impulse high voltage (5 kV_peak) is demonstrated. A comparison is also made between the modulation method and the nonmodulation method

Keywords

Pockels effect; automatic test equipment; automatic testing; charge measurement; electric breakdown; electric charge; electrical engineering computing; image processing; insulation testing; Pockels effect; charge polarity; computer image lock-in amplifier processing; computer image processing; dielectric material; discrimination; electrooptic surface charge measurement; impulse high voltage; insulating films; measurement system; performances; positive discharge streamer; quantification; sensitivity; signal to noise ratio; spatial optical phase modulation system; surface charge distribution; visualization; Charge measurement; Dielectric materials; Dielectrics and electrical insulation; Image processing; Optical films; Optical modulation; Optical noise; Stimulated emission; Surface discharges; Visualization;

fLanguage

English

Publisher

ieee

Conference_Titel

Properties and Applications of Dielectric Materials, 1994., Proceedings of the 4th International Conference on

Conference_Location

Brisbane, Qld.

Print_ISBN

0-7803-1307-0

Type

conf

DOI

10.1109/ICPADM.1994.414102

Filename

414102