Title :
Signal integrity and reliability of a new Multi-Stack Package using a Pressure Conductive Rubber
Author :
Kang, Kibum ; Byun, Jindo ; Jang, Jae-Won ; Lee, Hai-Young ; Choi, Jae-Hoon ; Hwang, Jae-Seon ; Lee, Dong-Chun
Author_Institution :
Dept. of Electron. Eng., Ajou Univ., Suwon, South Korea
Abstract :
A proposed Pressure Conductive Rubber (PCR) is used instead of conventional interconnections such as wire and solder bondings for a Multi-Stack Package (MSP). A PCR for a three-dimensional (3-D) high-density interconnection has a major advantage in that it can replace defective dies with known good dies (KGD). In the structure of the PCR in this study working through external pressure, conductive particles are arranged between insulating rubber. To compare the RF electrical performance of the PCR and the solder interconnection, a test-jig with coplanar waveguide (CPW) was assembled. S-parameters and reliability tests of MSP formations using the PCR and solder interconnection were separately measured in a frequency range from 300 KHz to 8 GHz. The measured results show the insertion loss of 1.72 dB and the return loss of 12.7 dB on a single-layer structure at 8 GHz. Additionally, reliability tests of the PCR show stable electrical performance. These results indicate that the RF electrical performance of the PCR is acceptable for use in DDR3 SDRAM (Double Data Rate 3 Synchronous Dynamic Random Access Memory) applications.
Keywords :
DRAM chips; S-parameters; coplanar waveguides; integrated circuit interconnections; integrated circuit packaging; integrated circuit reliability; rubber; semiconductor device reliability; 3-D high-density interconnection; DDR3 SDRAM; RF electrical performance; S-parameters; conductive particles; coplanar waveguide; double data rate 3 synchronous dynamic random access memory; external pressure; frequency 300 kHz to 8 GHz; insertion loss; insulating rubber; interconnections; multistack package; pressure conductive rubber; reliability tests; return loss; single-layer structure; solder bondings; test-jig; Bonding; Coplanar waveguides; Insulation; Packaging; Radio frequency; Rubber; SDRAM; Testing; Waveguide components; Wire;
Conference_Titel :
Advanced Packaging and Systems Symposium, 2008. EDAPS 2008. Electrical Design of
Conference_Location :
Seoul
Print_ISBN :
978-1-4244-2633-1
Electronic_ISBN :
978-1-4244-2634-8
DOI :
10.1109/EDAPS.2008.4736038