• DocumentCode
    2177369
  • Title

    Effectiveness of adaptive supply voltage and body bias as post-silicon variability compensation techniques for full-swing and low-swing on-chip communication channels

  • Author

    Paci, Giacomo ; Bertozzi, Davide ; Benini, Luca

  • Author_Institution
    DEIS, Univ. of Bologna, Bologna
  • fYear
    2009
  • fDate
    20-24 April 2009
  • Firstpage
    1404
  • Lastpage
    1409
  • Abstract
    Adaptive body bias (ABB) and adaptive supply voltage (ASV) have been showed to be effective methods for post-silicon tuning of circuit properties to reduce variability. While their properties have been compared on generic combinational circuits or microprocessor circuit sub-blocks, the advent of multi-core systems is bringing a new application domain forefront. Global interconnects are evolving to complex communication channels with drivers and receivers, in an attempt to mitigate the effects of reverse scaling and reduce power. The characterization of the performance spread of these links and the exploration of effective and power-aware compensation techniques for them is becoming a key design issue. This work compares the variability compensation efficiency of ABB vs ASV when put at work in two representative link architectures of today´s ICs: a traditional full-swing interconnect and a low-swing signaling scheme for low-power communication. We provide guidelines for the post-silicon variability compensation of these communication channels.
  • Keywords
    circuit tuning; integrated circuit design; integrated circuit interconnections; low-power electronics; adaptive body bias; adaptive supply voltage; circuit tuning; global interconnects; low-power communication; multi-core systems; on-chip communication channels; reverse scaling; variability compensation; Circuit optimization; Combinational circuits; Communication channels; Costs; Integrated circuit interconnections; Microprocessors; Network-on-a-chip; Tuning; Voltage; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation & Test in Europe Conference & Exhibition, 2009. DATE '09.
  • Conference_Location
    Nice
  • ISSN
    1530-1591
  • Print_ISBN
    978-1-4244-3781-8
  • Type

    conf

  • DOI
    10.1109/DATE.2009.5090884
  • Filename
    5090884