Preface

The Fault Diagnosis and Tolerance in Cryptography (FDTC) workshop brings together researchers and engineers with an interest in the effect of faults, either accidental or malicious, on integrated circuits implementing cryptographic algorithms. To promote the exchange of ideas among researchers who have been active in this field, the first workshop devoted to Fault Diagnosis and Tolerance in Cryptography (FDTC), was organized in June 2004. The workshop has since then become an annual event with the 2nd one held in Edinburgh, Scotland, in September 2005, the 3rd one in Yokohama, Japan, in October 2006, the 4th one in Vienna, Austria, in September 2007, the 5th one in Washington, DC, in August 2008 and the 6th one in Lausanne, Switzerland in September 2009. The FDTC workshops aim at covering all aspects of fault injection-based attacks on cryptographic devices and the corresponding countermeasures. This includes topics such as: modeling the reliability of cryptographic systems and protocols; inherently reliable cryptographic systems and algorithms; fault models for cryptographic devices (hardware and software); fault-injection-based attacks on cryptographic systems and protocols; adapting classical fault diagnosis and tolerance techniques to cryptographic systems; novel fault diagnosis and tolerance techniques for cryptographic systems; and case studies. Since 2007, the FDTC proceedings (including this one) are published by the IEEE-CS Press. The proceedings of FDTC 2010 include 8 regular papers and two invited papers. The papers cover both new fault-injection based attack techniques and various countermeasures against already known attacks on secret and public key cryptosystems.