Title :
Robust fault diagnosis in a chemical process using multiple-model approach
Author :
Patton, Ron J. ; Toribio, C. J Lopez ; Simani, Silvio
Author_Institution :
Dept. of Eng., Hull Univ., UK
Abstract :
Presents a robust model-based technique for the detection and isolation of sensor faults in a chemical process. The diagnosis system is based on the robust estimation of process outputs. A dynamic non-linear model of the process under investigation is obtained by a procedure exploiting Takagi-Sugeno (T-S) multiple-model fuzzy identification. The combined identification and residual generation schemes have robustness properties with respect to modelling uncertainty, disturbance and measurement noise, providing good sensitivity properties for fault detection and fault isolation. The identified system consists of a fuzzy combination of T-S models to detect changing plant operating conditions. Residual analysis and geometrical tests are then sufficient for fault detection and isolation, respectively. The procedure presented is applied to the problem of detecting and isolating faults in a benchmark simulation of a tank reactor chemical process
Keywords :
chemical technology; fault diagnosis; fuzzy systems; identification; process monitoring; redundancy; sensors; Takagi-Sugeno multiple-model fuzzy identification; analytical redundancy; chemical process; continuous stirred tank reactor; disturbance; dynamic nonlinear model; fault detection; fault isolation; fuzzy systems; geometrical tests; measurement noise; modelling uncertainty; multiple-model approach; process monitoring; residual analysis; residual generation; robust estimation; robust fault diagnosis; sensitivity properties; sensor faults; tank reactor process; Chemical processes; Chemical sensors; Fault detection; Fault diagnosis; Measurement uncertainty; Noise generators; Noise measurement; Noise robustness; Nonlinear dynamical systems; Takagi-Sugeno model;
Conference_Titel :
Decision and Control, 2001. Proceedings of the 40th IEEE Conference on
Conference_Location :
Orlando, FL
Print_ISBN :
0-7803-7061-9
DOI :
10.1109/.2001.980089