Title :
Analysis and design of feed-forward current mode amplifiers using individual suppression of complex harmonics
Author :
Bruck, Y. ; Burdo, G. ; Zelikson, M. ; Barger, A. ; Boreisha, L.
Author_Institution :
IBM Res. & Dev. Labs., Univ. of Haifa, Israel
Abstract :
We discuss a systematic, semi-analytical approach to the design of large signal current mode amplifiers. The main steps of the recently developed linearization technique, individual suppression of complex harmonics, are presented along with a short overview of existing linearization techniques. The technique is illustrated by two flavors of design of a transconductor amplifier, implemented in SiGe. The measured performance features large signal linearity of 78 dBc, linearization efficiency of 20 dBc and high robustness to process variations (the scatter of 90% of results is within ±1 dB). Although the procedure is demonstrated on particular examples, it is applicable to a wide class of current mode amplifiers.
Keywords :
Ge-Si alloys; Monte Carlo methods; amplifiers; circuit CAD; current-mode circuits; feedforward; harmonics; integrated circuit design; integrated circuit measurement; integrated circuit modelling; intermodulation; linearisation techniques; semiconductor materials; Monte-Carlo simulations; SiGe; SiGe feed-forward current mode amplifiers; feed-forward; harmonics cancellation; individual complex harmonics suppression; intermodulation; large signal current mode amplifier analysis/design; linear amplifiers; linearization efficiency; linearization techniques; process variation robustness; process variation scatter; signal linearity; systematic semi-analytical amplifier design; transconductor amplifiers; Feedforward systems; Germanium silicon alloys; Harmonic analysis; Linearity; Linearization techniques; Robustness; Signal design; Signal processing; Silicon germanium; Transconductors;
Conference_Titel :
Circuits and Systems for Communications, 2002. Proceedings. ICCSC '02. 1st IEEE International Conference on
Print_ISBN :
5-7422-0260-1
DOI :
10.1109/OCCSC.2002.1029052