DocumentCode :
2177849
Title :
Life prediction of multiple performance parameters ADT based on multidimensional time series analysis
Author :
Li Wang ; Zaiwen Liu ; Bo Wan ; Youhu Zhao
Author_Institution :
Sch. of Comput. & Inf. Eng., Beijing Technol. & Bus. Univ., Beijing, China
fYear :
2013
fDate :
28-31 Jan. 2013
Firstpage :
1
Lastpage :
6
Abstract :
For long lifetime and high reliability products, it is difficult to obtain failure data in a short time period. Hence, Accelerated Degradation Testing (ADT) is presented to deal with the cases where no failure time data could be obtained but degradation data of parameters of the product are available. At present, the ADT life prediction method is utilized primarily with feedback from a single performance parameter ADT dataset. However, for most products, multiple performance parameters of these products will degrade with time, leading to failure. It is important to note that often the products various performance parameters will interact with each other as the performance degrades. Hence, a correct life prediction based on ADT data must take into account the integrated effect of a product´s multiple performance parameters and the random effect of environmental variables. In the literature, such as in the noted references [1-5], ADT life prediction is studied using time series methods due to its excellent capability of stochastic and periodic information mining. However, life predictions using the time series method in present literature are all based upon a one-dimensional time series analysis. To take into account multiple dimensions of product performance degradation, it is important to study these parameters using an ADT life prediction based on a multidimensional time series analysis method.
Keywords :
failure analysis; life testing; time series; ADT life prediction method; accelerated degradation testing; failure; multidimensional time series analysis; multiple performance parameters; periodic information mining; product degradation; stochastic information mining; Data models; Degradation; Life estimation; Predictive models; Stress; Time series analysis; Yttrium; ADT; Life Prediction; Multidimensional Time Series; Multiple Performance Parameters;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability and Maintainability Symposium (RAMS), 2013 Proceedings - Annual
Conference_Location :
Orlando, FL
ISSN :
0149-144X
Print_ISBN :
978-1-4673-4709-9
Type :
conf
DOI :
10.1109/RAMS.2013.6517670
Filename :
6517670
Link To Document :
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