Title :
Storage life prediction of electromagnetic relay based on PoF analysis
Author :
Bo Wan ; Guicui Fu ; Nan Li ; Youhu Zhao ; Li Wang
Author_Institution :
Sch. of Reliability & Syst. Eng., Beihang Univ., Beijing, China
Abstract :
This paper proposed a storage life prediction method for air sealed electromagnetic relay based on Physics of Failure (PoF) analysis by an Accelerated Storage Degradation Test (ASDT) of the electromagnetic relay to forecast the component failure. Firstly, an Accelerated Storage Degradation Test (ASDT) of air sealed electromagnetic relay is designed and implemented based on the storage failure mechanism. Secondly, the PoF analysis such as Scanning Electron Microscope (SEM) energy spectrum analysis is designed for the contact of relay after ASDT. The organic compound content on contact is analyzed at each temperature testing samples. Then the time series method is applied to model the degradation path and the storage life is predicted according to the characteristic of ASDT data. Finally, based on the relationship between prediction of the storage life and organic contamination degree of the contact, the PoF model of contact contamination of electromagnetic relay is proposed, which presents the relationship between the storage residual life and the carbon content of the organic compound on the contact. It is meaningful to avoiding the redundant preventive maintenance and saving the maintenance costs.
Keywords :
electronics industry; failure analysis; life testing; maintenance engineering; relays; scanning electron microscopy; storage; time series; ASDT; Physics of Failure analysis; PoF analysis; SEM energy spectrum analysis; accelerated storage degradation test; air sealed electromagnetic relay; carbon content; component failure forecasting; contact organic compound content analysis; degradation path; maintenance cost saving; organic contamination degree; preventive maintenance; relay contact; scanning electron microscope; storage failure mechanism; storage life prediction method; storage residual life; time series method; Contact resistance; Degradation; Educational institutions; Electromagnetics; Relays; Reliability; Stress; Accelerated Degradation Test; Physics of Failure Model; Storage Failure Mechanism; Storage Life Prediction;
Conference_Titel :
Reliability and Maintainability Symposium (RAMS), 2013 Proceedings - Annual
Conference_Location :
Orlando, FL
Print_ISBN :
978-1-4673-4709-9
DOI :
10.1109/RAMS.2013.6517671