Title :
New Method to Solve the End Effect of Empirical Mode Decomposition
Author :
Zhang Leitao ; Chen Huanguo ; Li Jianmin ; Chen Wenhua
Author_Institution :
Sch. of Mech. & Autom. Control, Zhejiang Sci-Tech Univ., Hangzhou, China
Abstract :
The end sifting method has been proposed to solve the end effect problem of empirical mode decomposition (EMD). During the intrinsic mode function (IMF) sifting process by EMD method, a procedure including end effect judgment and end sifting, which is different from the traditional idea dealing with the problem by dictating or predicting an end point, is added. This method has greatly improved the precision of IMF.
Keywords :
signal processing; time-domain analysis; IMF; empirical mode decomposition; end effect judgment; end sifting method; intrinsic mode function sifting process; Automatic control; Automation; Circuits; Frequency; Hilbert space; Mirrors; NASA; Neural networks; Signal processing; Wavelet transforms;
Conference_Titel :
Image and Signal Processing, 2009. CISP '09. 2nd International Congress on
Conference_Location :
Tianjin
Print_ISBN :
978-1-4244-4129-7
Electronic_ISBN :
978-1-4244-4131-0
DOI :
10.1109/CISP.2009.5304936
