Title :
Bayesian probability approach for exponential AFT
Author_Institution :
Reliability Eng. CSeries, Bombardier Aerosp., Montreal, QC, Canada
Abstract :
The present paper provides a step down stress, acceleration parameter free method of testing for Reliability. The main advantages of the method are 1) optimization of the testing time by failing most of the samples at the highly accelerated level and 2) an acceleration model is not required. The approach is based on determining the cumulative distribution values as random variables which allows free adjustment of the results on the data. The paper also illustrates an experimental example.
Keywords :
Bayes methods; life testing; reliability; statistical distributions; Bayesian probability approach; accelerated failure time; accelerated life test; acceleration parameter free method; cumulative distribution value; exponential AFT; reliability test; testing time optimization; Acceleration; Bayes methods; Life estimation; Mathematical model; Random variables; Reliability; Stress; accelerated life test ALT; acceleration model free; exponential life; test optimization;
Conference_Titel :
Reliability and Maintainability Symposium (RAMS), 2013 Proceedings - Annual
Conference_Location :
Orlando, FL
Print_ISBN :
978-1-4673-4709-9
DOI :
10.1109/RAMS.2013.6517718
