DocumentCode :
2179380
Title :
Characteristic instantaneous relevant reversible failures and reliability of modern mass-produced electronics
Author :
Verbitsky, D.E.
Author_Institution :
Alefa-EEQE, Edison, NJ, USA
fYear :
2013
fDate :
28-31 Jan. 2013
Firstpage :
1
Lastpage :
9
Abstract :
Typical instantaneous relevant reversible failures (IRRF) of modern electronics and their role are defined and classified. Characteristic prevalent IRRF are exemplified and analyzed across technologies and applications. Matching interactions of parametric shifts and anomalies, imbalanced tight tolerance and low resilience system under complex stresses are shown to cause most characteristic IRRF. Their relation with project-relevant features, functions, factors and faults are discussed, as are their links with isentropic phenomena. Systemic early failure analysis (FA) is again shown to be a vital part of modern responsible and profitable quality and reliability assurance. Practical recommendations resulted in concurrent improvement of customer satisfaction and yield, as well as facilitation of operations and R&D.
Keywords :
electronics industry; failure analysis; quality assurance; reliability; research and development; R&D; characteristic IRRF; characteristic instantaneous relevant reversible failures; characteristic prevalent IRRF; complex stresses; concurrent improvement; customer satisfaction; imbalanced tight tolerance; isentropic phenomena; low resilience system; matching interactions; modern mass-produced electronics; parametric anomaly; parametric shifts; project-relevant features; quality assurance; reliability assurance; systemic early failure analysis; Degradation; Reliability; Resilience; Resistance; Resistors; Stress; Testing; FA; classification; environment stresses; instantaneous failures; profitability; quality; reliability; resilience;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability and Maintainability Symposium (RAMS), 2013 Proceedings - Annual
Conference_Location :
Orlando, FL
ISSN :
0149-144X
Print_ISBN :
978-1-4673-4709-9
Type :
conf
DOI :
10.1109/RAMS.2013.6517721
Filename :
6517721
Link To Document :
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