Title :
Research on Fault Tree Based Complex Electronic Device Fault Diagnosis Expert System
Author :
Xiao-lin, Liang ; Qing-zhen, Yang
Author_Institution :
Sch. of Inf. & Technol., Hebei Univ. of Econ. & Bus., Shijiazhuang, China
Abstract :
Quick and accurate diagnosis and maintenance on complex electronic devices important issue that needs to be resolved urgently. Based on the construction of some type complex electronic device fault tree model and calculation methods of minimal cut sets importance degree and top event probability, the paper introduced fault tree into fault diagnosis expert system and solved key issues related to the system design. The constructed system can solve the problems of poor commonly usability, low degree of automation and complex operation that of original test devices, which provides effective solution for fault diagnosis of complex electronic devices.
Keywords :
electronic engineering computing; expert systems; fault diagnosis; fault trees; set theory; complex electronic device; fault diagnosis expert system; fault tree model; minimal cut set; Diagnostic expert systems; Electronic equipment testing; Fault diagnosis; Fault trees; Phase locked loops; Probability; Radio control; Radio transmitters; Radiofrequency integrated circuits; Tuned circuits; complex electronic devices; expert system; fault diagnosis; fault tree;
Conference_Titel :
Data Storage and Data Engineering (DSDE), 2010 International Conference on
Conference_Location :
Bangalore
Print_ISBN :
978-1-4244-5678-9
DOI :
10.1109/DSDE.2010.9
