• DocumentCode
    2179777
  • Title

    Geometric camera calibration: theory and experiments

  • Author

    Kachi, Dj ; Tu, X.W.

  • Author_Institution
    Centre de Recherches de Royallieu, Compiegne, France
  • fYear
    1994
  • fDate
    25-27 May 1994
  • Firstpage
    298
  • Lastpage
    303
  • Abstract
    It is known from geometric optics that any system of lenses can be approximated by a system which realizes a perspective projection of a 3D scene onto a 2D plate. Projective geometry is an efficient tool to investigate such an image forming system. This paper treats the problem of calibrating cameras using this tool. In this work, a new formulation of calibrating a moving camera is presented, and is based on the absolute conic properties. The projective invariance of the absolute conic under rigid motion ensures that its image is independent of camera position, and depends only on the intrinsic parameters of the camera. The camera calibration is computed in two steps. First, the estimation of the coefficients of the epipolar transformation is estimated. The computation of the absolute conic image is based on the pole and polar of the conic. Then, relations between intrinsic parameters and coefficients of the absolute conic image are then deduced. Both computer-generated and real data are included in experiments, which illustrates how the method works. This technique is integrated in an iterative filtering scheme
  • Keywords
    calibration; cameras; computer vision; filtering and prediction theory; geometrical optics; iterative methods; motion estimation; absolute conic image; absolute conic properties; computer-generated data; epipolar transformation; geometric camera calibration; geometric optics; image forming system; iterative filtering scheme; projective geometry; real data; rigid motion; Calibration; Cameras; Equations; Geometrical optics; Geometry; Layout; Lenses; Motion analysis; Tiles; Yield estimation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics, 1994. Symposium Proceedings, ISIE '94., 1994 IEEE International Symposium on
  • Conference_Location
    Santiago
  • Print_ISBN
    0-7803-1961-3
  • Type

    conf

  • DOI
    10.1109/ISIE.1994.333101
  • Filename
    333101