• DocumentCode
    2179830
  • Title

    Accelerated testing for 2-year storage

  • Author

    Schenkelberg, F.

  • Author_Institution
    Ops A La Carte, LLC, Los Gatos, CA, USA
  • fYear
    2013
  • fDate
    28-31 Jan. 2013
  • Firstpage
    1
  • Lastpage
    7
  • Abstract
    Two accelerated life tests (ALT´s) explored two failure mechanisms of concern for a product expected to experience a 2-year storage period. Each ALT focused on a specific failure mechanism and required different applied stress.
  • Keywords
    failure analysis; life testing; storage; ALT; accelerated life test; accelerated testing; failure mechanism; product storage; time 2 yr; Failure analysis; Joints; Stress; Temperature distribution; Thermal stability; accelerated testing; failure mechanisms; storage; test design;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium (RAMS), 2013 Proceedings - Annual
  • Conference_Location
    Orlando, FL
  • ISSN
    0149-144X
  • Print_ISBN
    978-1-4673-4709-9
  • Type

    conf

  • DOI
    10.1109/RAMS.2013.6517740
  • Filename
    6517740
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2179830