Title :
Accelerated testing for 2-year storage
Author :
Schenkelberg, F.
Author_Institution :
Ops A La Carte, LLC, Los Gatos, CA, USA
Abstract :
Two accelerated life tests (ALT´s) explored two failure mechanisms of concern for a product expected to experience a 2-year storage period. Each ALT focused on a specific failure mechanism and required different applied stress.
Keywords :
failure analysis; life testing; storage; ALT; accelerated life test; accelerated testing; failure mechanism; product storage; time 2 yr; Failure analysis; Joints; Stress; Temperature distribution; Thermal stability; accelerated testing; failure mechanisms; storage; test design;
Conference_Titel :
Reliability and Maintainability Symposium (RAMS), 2013 Proceedings - Annual
Conference_Location :
Orlando, FL
Print_ISBN :
978-1-4673-4709-9
DOI :
10.1109/RAMS.2013.6517740
