• DocumentCode
    2179911
  • Title

    Reliability modeling that combines Markov analysis and Weibull distributions

  • Author

    Jackson, Andrew

  • Author_Institution
    Eng., Technol. & Field Oper., Raytheon Tech. Services Co., El Segundo, CA, USA
  • fYear
    2013
  • fDate
    28-31 Jan. 2013
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    When systems possess components with wearout failure characteristics or non-constant hazard rates and in standby redundancy configurations, the most common method currently utilized in industry for handling the reliability predictions of such systems is based on Monte Carlo Simulations. Monte Carlo Simulations are relatively easy to develop, but accuracy of the approximations that are produced dependents on the number of simulation trials selected. To obtain high accuracy for moderately complex system reliability models, Monte Carlo Simulation based system reliability models need to be run for large numbers of trials, in many cases greater than 10,000 trials, to achieve accuracy to the 4th or 5th decimal, which is sometimes required for Department of Defense (DoD) contracts in the aerospace industry. Markov Analysis is an alternate approach for modeling system reliability, which produces higher accuracy results than Monte Carlo Simulation based modeling, and requires fewer iterations.
  • Keywords
    Markov processes; Monte Carlo methods; Weibull distribution; aerospace industry; defence industry; failure analysis; hazards; reliability; Department of Defense contracts; DoD contract; Markov analysis; Monte Carlo simulation; Weibull distribution; aerospace industry; nonconstant hazard rate; redundancy configuration; reliability prediction handling; system reliability modeling; wearout failure characteristics; Approximation methods; Equations; Hazards; Markov processes; Mathematical model; Redundancy; Markov Analysis; Numeric Integration; Redundancy; Reliability; State Transition Diagram; Weibull;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium (RAMS), 2013 Proceedings - Annual
  • Conference_Location
    Orlando, FL
  • ISSN
    0149-144X
  • Print_ISBN
    978-1-4673-4709-9
  • Type

    conf

  • DOI
    10.1109/RAMS.2013.6517742
  • Filename
    6517742