DocumentCode
2179911
Title
Reliability modeling that combines Markov analysis and Weibull distributions
Author
Jackson, Andrew
Author_Institution
Eng., Technol. & Field Oper., Raytheon Tech. Services Co., El Segundo, CA, USA
fYear
2013
fDate
28-31 Jan. 2013
Firstpage
1
Lastpage
6
Abstract
When systems possess components with wearout failure characteristics or non-constant hazard rates and in standby redundancy configurations, the most common method currently utilized in industry for handling the reliability predictions of such systems is based on Monte Carlo Simulations. Monte Carlo Simulations are relatively easy to develop, but accuracy of the approximations that are produced dependents on the number of simulation trials selected. To obtain high accuracy for moderately complex system reliability models, Monte Carlo Simulation based system reliability models need to be run for large numbers of trials, in many cases greater than 10,000 trials, to achieve accuracy to the 4th or 5th decimal, which is sometimes required for Department of Defense (DoD) contracts in the aerospace industry. Markov Analysis is an alternate approach for modeling system reliability, which produces higher accuracy results than Monte Carlo Simulation based modeling, and requires fewer iterations.
Keywords
Markov processes; Monte Carlo methods; Weibull distribution; aerospace industry; defence industry; failure analysis; hazards; reliability; Department of Defense contracts; DoD contract; Markov analysis; Monte Carlo simulation; Weibull distribution; aerospace industry; nonconstant hazard rate; redundancy configuration; reliability prediction handling; system reliability modeling; wearout failure characteristics; Approximation methods; Equations; Hazards; Markov processes; Mathematical model; Redundancy; Markov Analysis; Numeric Integration; Redundancy; Reliability; State Transition Diagram; Weibull;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability and Maintainability Symposium (RAMS), 2013 Proceedings - Annual
Conference_Location
Orlando, FL
ISSN
0149-144X
Print_ISBN
978-1-4673-4709-9
Type
conf
DOI
10.1109/RAMS.2013.6517742
Filename
6517742
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