Statistical results on the emp conductive susceptibility of a serial network measurement and control device

Author

Li-Hua, Shi ; Yang, Yu ; Ying-Hui, Zhou ; Bi-hua, Zhou

Author_Institution

Nanjing Eng. Inst., Nanjing, China

fYear

2009

fDate

16-20 Sept. 2009

Firstpage

13

Lastpage

16

Abstract

The EMP conductive susceptibility of a measurement and control device used in automatic management system is studied by experimental test. Two EMP waveforms with different rise time are applied to the devices. Responses of the EUT are measured and compared. The sensitivity thresholds of EUT are analyzed by statistical method. Results show the EMP with fast leading edge tends to cause more serious interference when its amplitude remains the same as the EMP with slow leading edge.

Keywords

automatic test equipment; electromagnetic pulse; statistical analysis; EMP conductive susceptibility; automatic management system; control device; sensitivity thresholds; serial network measurement; slow leading edge; statistical results; Communication cables; Conductivity measurement; Control systems; EMP radiation effects; Electrical equipment industry; Electromagnetic measurements; Interference; Probes; Protection; System testing; conductive susceptibility; coupling; electromagnetic Pulse (EMP); failure rate (FR);

fLanguage

English

Publisher

ieee

Conference_Titel

Environmental Electromagnetics, 2009. CEEM 2009. 5th Asia-Pacific Conference on

Conference_Location

Xian

Print_ISBN

978-1-4244-4344-4

Type

conf

DOI

10.1109/CEEM.2009.5305003

Filename

5305003