Title :
Statistical results on the emp conductive susceptibility of a serial network measurement and control device
Author :
Li-Hua, Shi ; Yang, Yu ; Ying-Hui, Zhou ; Bi-hua, Zhou
Author_Institution :
Nanjing Eng. Inst., Nanjing, China
Abstract :
The EMP conductive susceptibility of a measurement and control device used in automatic management system is studied by experimental test. Two EMP waveforms with different rise time are applied to the devices. Responses of the EUT are measured and compared. The sensitivity thresholds of EUT are analyzed by statistical method. Results show the EMP with fast leading edge tends to cause more serious interference when its amplitude remains the same as the EMP with slow leading edge.
Keywords :
automatic test equipment; electromagnetic pulse; statistical analysis; EMP conductive susceptibility; automatic management system; control device; sensitivity thresholds; serial network measurement; slow leading edge; statistical results; Communication cables; Conductivity measurement; Control systems; EMP radiation effects; Electrical equipment industry; Electromagnetic measurements; Interference; Probes; Protection; System testing; conductive susceptibility; coupling; electromagnetic Pulse (EMP); failure rate (FR);
Conference_Titel :
Environmental Electromagnetics, 2009. CEEM 2009. 5th Asia-Pacific Conference on
Conference_Location :
Xian
Print_ISBN :
978-1-4244-4344-4
DOI :
10.1109/CEEM.2009.5305003
