Title :
A universal integrated circuit RF noise filtering capability measurement method
Author :
Nan, Liu ; Yao, Wu ; Yuan, Kang Feng
Author_Institution :
Sch. of Optoelectron. Inf. & Commun. Eng., Beijing Inf. Sci. & Technol. Univ., Beijing, China
Abstract :
Generally, the measurement of radio frequency (RF) noise filtering capability is a necessary part in the design of integrated circuit productions. In this paper, the authors propose a universal integrated circuit RF noise filtering capability measurement method-RF anechoic chamber. During the test, we put the integrated circuit in anechoic chamber, which provides a controllable RF signal electrical level, standing for the interface intensity when the integrated circuit works. By measure the results from voltmeter, we get the RF noise filtering capability of the integrated circuit. This novel measurement method is useful for selecting IC method and helpful to get a suitable integrated circuit which could resist the RF noise.
Keywords :
integrated circuit design; integrated circuit manufacture; integrated circuit measurement; integrated circuit noise; integrated circuit testing; radiofrequency filters; radiofrequency integrated circuits; voltmeters; RF signal electrical level control; integrated circuit RF anechoic chamber; integrated circuit production design; interface intensity; universal integrated circuit RF noise filtering capability measurement method; voltmeter; Antenna measurements; Educational institutions; Filtering; Integrated circuits; Noise; Noise measurement; Radio frequency; RF; anechoic chamber; integrated circuit;
Conference_Titel :
Electronics, Communications and Control (ICECC), 2011 International Conference on
Conference_Location :
Zhejiang
Print_ISBN :
978-1-4577-0320-1
DOI :
10.1109/ICECC.2011.6066712