Title :
Reliability prediction of constant fraction discriminator using modified PoF approach
Author :
Thaduri, A. ; Verma, Anil Kumar ; Gopika, V. ; Kumar, Udaya
Author_Institution :
Lulea Univ. of Technol., Lulea, Sweden
Abstract :
In this paper, the introduction, functioning and importance of constant fraction discriminator in nuclear field was studied. Furthermore, reliability and degradation mechanisms that affects the performance of output pulse with temperature and dose rates acts as input characteristics was properly explained and verified with the experiments. Accelerated testing was carried out to define the life testing of the component with respect to degradation in output TTL pulse amplitude. Time to failure was to be properly quantified and modelled accordingly.
Keywords :
failure analysis; life testing; nuclear engineering; reliability; transistor-transistor logic; accelerated testing; constant fraction discriminator; degradation mechanism; input characteristics; life testing; modified PoF approach; nuclear field; output TTL pulse amplitude; output pulse performance; reliability mechanism; reliability prediction; time to failure; Computational fluid dynamics; Degradation; Stress; Temperature; Temperature measurement; Testing; Transistors; Accelerated Testing; Constant Fraction Discriminator; Design of Experiments; Physics of Failure; Radiation testing;
Conference_Titel :
Reliability and Maintainability Symposium (RAMS), 2013 Proceedings - Annual
Conference_Location :
Orlando, FL
Print_ISBN :
978-1-4673-4709-9
DOI :
10.1109/RAMS.2013.6517746
