Title :
Modeling of the Resistive and Inductive Behaviour of Layered and Coated Conductors
Author :
Demeester, Thomas ; De Zutter, Daniel
Author_Institution :
Ghent Univ., Ghent
Abstract :
On-chip conductors have a finite thickness and are often composed of different metals. An efficient method to model the broadband resistive and inductive behaviour of such conductors is derived and applied to a few illustrative configurations.
Keywords :
boundary integral equations; conductors (electric); transmission line theory; inductive behaviour; layered coated conductors; on-chip conductors; resistive bahaviour; Admittance; Conducting materials; Conductivity; Conductors; Dielectric substrates; Disruption tolerant networking; Frequency; Inductance; Integral equations; Shape;
Conference_Titel :
Electrical Performance of Electronic Packaging, 2007 IEEE
Conference_Location :
Atlanta, GA
Print_ISBN :
978-1-4244-0883-2
DOI :
10.1109/EPEP.2007.4387166
