DocumentCode :
2180693
Title :
A Recovery Algorithm of Linear Complexity in the Time-Domain Layered Finite Element Reduction Recovery (LAFE-RR) Method for Large Scale Electromagnetic Analysis of High-Speed ICs
Author :
Gan, Houle ; Jiao, Dan
Author_Institution :
Purdue Univ, Lafayette
fYear :
2007
fDate :
29-31 Oct. 2007
Firstpage :
287
Lastpage :
290
Abstract :
Time-domain layered finite element reduction recovery (LAFE-RR) method was recently developed for large scale electromagnetic analysis of high-speed ICs. This method is capable of analytically and rigorously reducing the system matrix of a 3D multilayer circuit to that of a single layer one irrespective of the original problem size. In addition, it preserves the sparsity of the original system matrix. In this paper, we propose an efficient algorithm to recover the volume unknowns in the time-domain LAFE-RR method. This algorithm constitutes a direct solution of the matrix formed by volume unknowns in each layer. This direct solution possesses a linear complexity in both CPU run time and memory consumption. The cost of matrix factorization is negligible. The cost of matrix solution is linear. Numerical and experimental results have demonstrated the accuracy and efficiency of the proposed algorithm.
Keywords :
circuit analysis computing; computational complexity; electromagnetic fields; finite element analysis; integrated circuit modelling; matrix decomposition; time-domain analysis; 3D multilayer circuit; high-speed integrated circuit; large scale electromagnetic analysis; linear complexity; matrix factorization; recovery algorithm; time-domain layered finite element reduction recovery; Central Processing Unit; Circuit simulation; Costs; Electromagnetic analysis; Finite element methods; Large-scale systems; Nonhomogeneous media; Sparse matrices; Time domain analysis; Very large scale integration; On-chip; electromagnetic simulation; large-scale; time domain;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Performance of Electronic Packaging, 2007 IEEE
Conference_Location :
Atlanta, GA
Print_ISBN :
978-1-4244-0883-2
Type :
conf
DOI :
10.1109/EPEP.2007.4387183
Filename :
4387183
Link To Document :
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