Title :
Broadband On-Wafer Calibrations Comparison for Accuracy and Repeatability on Co-Planar Waveguide Structures
Author :
Li, Qian ; Melde, Kathleen L.
Author_Institution :
Univ. of Arizona, Tucson
Abstract :
This paper compares four popular on-wafer calibration methods including multiline TRL, LRRM, LRM, and SOLT, based on three diverse coplanar waveguide circuits. The results show that the Multiline TRL provides the highest accuracy and repeatability for all of the circuits up to 40 GHz.
Keywords :
calibration; coplanar waveguides; microwave circuits; LRM; LRRM; SOLT; broadband on-wafer calibrations; coplanar waveguide circuits; coplanar waveguide structures; multiline TRL; Calibration; Circuit simulation; Coplanar waveguides; Electronics packaging; Frequency measurement; Impedance; Measurement standards; Performance evaluation; Probes; Scattering parameters;
Conference_Titel :
Electrical Performance of Electronic Packaging, 2007 IEEE
Conference_Location :
Atlanta, GA
Print_ISBN :
978-1-4244-0883-2
DOI :
10.1109/EPEP.2007.4387190
