• DocumentCode
    2180892
  • Title

    Broadband On-Wafer Calibrations Comparison for Accuracy and Repeatability on Co-Planar Waveguide Structures

  • Author

    Li, Qian ; Melde, Kathleen L.

  • Author_Institution
    Univ. of Arizona, Tucson
  • fYear
    2007
  • fDate
    29-31 Oct. 2007
  • Firstpage
    315
  • Lastpage
    318
  • Abstract
    This paper compares four popular on-wafer calibration methods including multiline TRL, LRRM, LRM, and SOLT, based on three diverse coplanar waveguide circuits. The results show that the Multiline TRL provides the highest accuracy and repeatability for all of the circuits up to 40 GHz.
  • Keywords
    calibration; coplanar waveguides; microwave circuits; LRM; LRRM; SOLT; broadband on-wafer calibrations; coplanar waveguide circuits; coplanar waveguide structures; multiline TRL; Calibration; Circuit simulation; Coplanar waveguides; Electronics packaging; Frequency measurement; Impedance; Measurement standards; Performance evaluation; Probes; Scattering parameters;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Performance of Electronic Packaging, 2007 IEEE
  • Conference_Location
    Atlanta, GA
  • Print_ISBN
    978-1-4244-0883-2
  • Type

    conf

  • DOI
    10.1109/EPEP.2007.4387190
  • Filename
    4387190
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2180892