DocumentCode :
2181150
Title :
Electromagnetic Simulation for Inhomogeneous Interconnect and Packaging Structures
Author :
Jiang, Lijun ; Rubin, Barry J. ; Liu, Yuan ; Morsey, Jason D. ; Deustch, Alina
Author_Institution :
IBM T. J. Watson Res. Center, Yorktown Heights
fYear :
2007
fDate :
29-31 Oct. 2007
Firstpage :
357
Lastpage :
360
Abstract :
The paper contains a novel mechanism for full wave electromagnetic simulation of complicated inhomogeneous structures, such as on-chip interconnects, IC packaging, antennas, and scattering objects. It uses only equivalent principle based EFIE instead of both EFIE and MFIE to establish the surface integral equations for practical inhomogeneous structure so that a much more simplified formulation process is needed in the EM simulation procedure. To overcome the numerical error of K operator in the formulation, a new analytical solution to the K operator for general full-wave integral equations is provided. Numerical results are demonstrated to verify the proposed algorithm.
Keywords :
computational electromagnetics; electric field integral equations; equivalence classes; integrated circuit interconnections; integrated circuit packaging; EM simulation; K operator; equivalent principle based EFIE; full wave electromagnetic simulation; full-wave integral equations; inhomogeneous interconnect; packaging structures; surface integral equations; Conductors; Current; Dielectrics; Electromagnetic scattering; Integral equations; Magnetic fields; Nonuniform electric fields; Packaging; Surface reconstruction; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Performance of Electronic Packaging, 2007 IEEE
Conference_Location :
Atlanta, GA
Print_ISBN :
978-1-4244-0883-2
Type :
conf
DOI :
10.1109/EPEP.2007.4387202
Filename :
4387202
Link To Document :
بازگشت