• DocumentCode
    2181150
  • Title

    Electromagnetic Simulation for Inhomogeneous Interconnect and Packaging Structures

  • Author

    Jiang, Lijun ; Rubin, Barry J. ; Liu, Yuan ; Morsey, Jason D. ; Deustch, Alina

  • Author_Institution
    IBM T. J. Watson Res. Center, Yorktown Heights
  • fYear
    2007
  • fDate
    29-31 Oct. 2007
  • Firstpage
    357
  • Lastpage
    360
  • Abstract
    The paper contains a novel mechanism for full wave electromagnetic simulation of complicated inhomogeneous structures, such as on-chip interconnects, IC packaging, antennas, and scattering objects. It uses only equivalent principle based EFIE instead of both EFIE and MFIE to establish the surface integral equations for practical inhomogeneous structure so that a much more simplified formulation process is needed in the EM simulation procedure. To overcome the numerical error of K operator in the formulation, a new analytical solution to the K operator for general full-wave integral equations is provided. Numerical results are demonstrated to verify the proposed algorithm.
  • Keywords
    computational electromagnetics; electric field integral equations; equivalence classes; integrated circuit interconnections; integrated circuit packaging; EM simulation; K operator; equivalent principle based EFIE; full wave electromagnetic simulation; full-wave integral equations; inhomogeneous interconnect; packaging structures; surface integral equations; Conductors; Current; Dielectrics; Electromagnetic scattering; Integral equations; Magnetic fields; Nonuniform electric fields; Packaging; Surface reconstruction; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Performance of Electronic Packaging, 2007 IEEE
  • Conference_Location
    Atlanta, GA
  • Print_ISBN
    978-1-4244-0883-2
  • Type

    conf

  • DOI
    10.1109/EPEP.2007.4387202
  • Filename
    4387202