DocumentCode
2181150
Title
Electromagnetic Simulation for Inhomogeneous Interconnect and Packaging Structures
Author
Jiang, Lijun ; Rubin, Barry J. ; Liu, Yuan ; Morsey, Jason D. ; Deustch, Alina
Author_Institution
IBM T. J. Watson Res. Center, Yorktown Heights
fYear
2007
fDate
29-31 Oct. 2007
Firstpage
357
Lastpage
360
Abstract
The paper contains a novel mechanism for full wave electromagnetic simulation of complicated inhomogeneous structures, such as on-chip interconnects, IC packaging, antennas, and scattering objects. It uses only equivalent principle based EFIE instead of both EFIE and MFIE to establish the surface integral equations for practical inhomogeneous structure so that a much more simplified formulation process is needed in the EM simulation procedure. To overcome the numerical error of K operator in the formulation, a new analytical solution to the K operator for general full-wave integral equations is provided. Numerical results are demonstrated to verify the proposed algorithm.
Keywords
computational electromagnetics; electric field integral equations; equivalence classes; integrated circuit interconnections; integrated circuit packaging; EM simulation; K operator; equivalent principle based EFIE; full wave electromagnetic simulation; full-wave integral equations; inhomogeneous interconnect; packaging structures; surface integral equations; Conductors; Current; Dielectrics; Electromagnetic scattering; Integral equations; Magnetic fields; Nonuniform electric fields; Packaging; Surface reconstruction; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Performance of Electronic Packaging, 2007 IEEE
Conference_Location
Atlanta, GA
Print_ISBN
978-1-4244-0883-2
Type
conf
DOI
10.1109/EPEP.2007.4387202
Filename
4387202
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