Title :
Effective efficiency measurement results conducted on a X-band thin film waveguide barretter mount developed at NPL, New Delhi
Author :
Bhatnagar, H.M. ; Kothari, P.C.
Author_Institution :
Nat. Phys. Lab., New Delhi, India
fDate :
June 27 1994-July 1 1994
Abstract :
Effective efficiency measurements have been conducted at 10.0 GHz using a single load microcalorimetric technique on a thin film primary standard waveguide barretter mount designed and fabricated at National Physical Laboratory, New Delhi. The same mount was taken to three National Laboratories, namely NIST, USA; KRISS, Republic of Korea; PTB, Germany for an international comparison of effective efficiency measurements. This paper briefly describes the techniques employed for the measurement of effective efficiency of bolometer mounts by these countries. The results of effective efficiency are reported and intercompared.<>
Keywords :
bolometers; calorimetry; measurement standards; microwave measurement; thin film resistors; 10 GHz; Germany; KRISS; Korea; NIST; NPL; National Physical Laboratory; New Delhi; PTB; USA; X-band thin film waveguide barretter mount; bolometer mounts; effective efficiency measurement; international comparison; microcalorimetric technique; primary standard; Bolometers; Copper; Frequency; Laboratories; Measurement standards; NIST; Performance evaluation; Standards development; Thin wall structures; Transistors;
Conference_Titel :
Precision Electromagnetic Measurements, 1994. Digest., 1994 Conference on
Conference_Location :
Boulder, CO, USA
Print_ISBN :
0-7803-1984-2
DOI :
10.1109/CPEM.1994.333209
