Title :
A new optical wavelength ratio measurement apparatus: the fringe counting sigmameter
Author :
Juncar, P. ; Elandaloussi, H. ; Himbert, M. ; Pinard, J. ; Razet, K.
Author_Institution :
Inst. Nat. de Metrol., CNRS, Paris, France
fDate :
June 27 1994-July 1 1994
Abstract :
A new compact and achromatic Michelson-type interferometer with a variable path difference is presented. This "fringe-counting sigmameter" allows one to measure optical wavelength ratios between two radiations emitted by stabilized lasers. Maintained in vacuum, this apparatus can determine wavelength/frequency laser radiation from 0.36 /spl mu/m to 1.5 /spl mu/m with a relative accuracy of 5.10/sup -9/, with the use of a reference stabilized He-Ne laser.<>
Keywords :
frequency measurement; gas lasers; helium; laser variables measurement; light interferometers; measurement standards; neon; 0.36 to 1.5 mum; He-Ne; achromatic Michelson-type interferometer; data acquisition; fringe counting sigmameter; fringe-counting sigmameter; optical frequency measurement; optical wavelength ratio measurement apparatus; reference stabilized He-Ne laser; relative accuracy; variable path difference; wavelength/frequency laser radiation; Cotton; Laser stability; Optical interferometry; Optical refraction; Optical variables control; Phase detection; Polarization; Position measurement; Stimulated emission; Wavelength measurement;
Conference_Titel :
Precision Electromagnetic Measurements, 1994. Digest., 1994 Conference on
Conference_Location :
Boulder, CO, USA
Print_ISBN :
0-7803-1984-2
DOI :
10.1109/CPEM.1994.333221
