Title :
RF-trap apparatus for optical frequency standards
Author :
Jefferts, S.R. ; Monroe, C. ; Barton, A.S. ; Wineland, D.J.
Author_Institution :
Time & Frequency Div., Nat. Inst. of Stand. & Technol., Boulder, CO, USA
fDate :
June 27 1994-July 1 1994
Abstract :
A novel RF (Paul) ion trap apparatus, capable of providing extremely tight confinement is described. Strong localization of trapped ions reduces an important source of noise when using the ions as an optical frequency standard. Alternative cooling schemes, which provide stronger localization than conventional Doppler cooling are also discussed.<>
Keywords :
beam handling equipment; frequency measurement; ion beams; measurement standards; particle traps; radiation pressure (atoms); Doppler cooling; Paul ion trap; RF-trap apparatus; optical frequency standards; tight confinement; trapped ions localisation; Charge carrier processes; Cooling; Electrodes; Frequency; Optical design; Optical modulation; Particle beam optics; Spectroscopy; Stationary state; Voltage;
Conference_Titel :
Precision Electromagnetic Measurements, 1994. Digest., 1994 Conference on
Conference_Location :
Boulder, CO, USA
Print_ISBN :
0-7803-1984-2
DOI :
10.1109/CPEM.1994.333231
