Title :
Modeling of a Rotational Spectrometer by Ray Tracing Methods
Author :
Lacik, J. ; Lukes, Z. ; Raida, Z.
Author_Institution :
Brno Univ. of Technol., Brno
Abstract :
In this paper the ray tracing method is developed and used for the modeling of a rotational spectrometer. Since the electrical size of the spectrometer is several thousands times longer compared to the wavelength, the presented approach is much suitable for the analysis of such huge devices than the classical numerical exact methods such as the fast integral methods.
Keywords :
microwave devices; microwave spectrometers; ray tracing; ray tracing; rotational spectrometer modeling; Electromagnetic analysis; Electromagnetic diffraction; Electromagnetic wave absorption; Frequency; Microwave devices; Microwave theory and techniques; Polarization; Ray tracing; Space technology; Spectroscopy;
Conference_Titel :
Electromagnetics in Advanced Applications, 2007. ICEAA 2007. International Conference on
Conference_Location :
Torino
Print_ISBN :
978-1-4244-0767-5
Electronic_ISBN :
978-1-4244-0767-5
DOI :
10.1109/ICEAA.2007.4387297
