DocumentCode
2183392
Title
High density SMT assemblies based on flex substrates
Author
Larmouth, Robert ; Keating, James
Author_Institution
Teledyne Electron. Technol., Hudson, NH, USA
fYear
1998
fDate
9-11 Jun 1998
Firstpage
45
Lastpage
51
Abstract
The industry trend to shrink semiconductor device packages while increasing I/O count results in demands on the printed circuit boards to which these devices are assembled. An increase in wiring density is required at the board level, often equating to higher costs and/or layer counts. In many cases, designers are looking to multilayer flexible circuits as the next level of interconnect for a wide range of packaging technologies from fine-pitch surface mount to chip-scale packages to direct-chip attach. Challenges associated with a flex-based solution include assembly compatibility, material costs and reliability. This paper reviews work by Teledyne Electronic Technologies (TET) to address these board level interconnect challenges for several custom applications. An approach employing flexible multilayer substrates which incorporate fine-line circuitry, small vias and flexible soldermask is examined. A test vehicle designed and built to accommodate micro-BGA packages is used to illustrate the density achieved and to provide a platform for demonstrating assembly and reliability attributes. This test vehicle is also being used to evaluate materials and process technologies applicable to high density SMT assemblies
Keywords
assembling; fine-pitch technology; integrated circuit packaging; integrated circuit reliability; printed circuit manufacture; surface mount technology; wiring; I/O count; Teledyne Electronic Technologies; assembly compatibility; board level; chip-scale packages; custom applications; direct-chip attach; fine-line circuitry; fine-pitch surface mount; flex substrates; flexible soldermask; high density SMT assemblies; material costs; micro-BGA packages; multilayer flexible circuits; multilayer substrates; packaging technologies; printed circuit boards; reliability; reliability attributes; semiconductor device packages; wiring density; Assembly; Chip scale packaging; Circuit testing; Costs; Electronics packaging; Flexible printed circuits; Integrated circuit interconnections; Nonhomogeneous media; Substrates; Surface-mount technology;
fLanguage
English
Publisher
ieee
Conference_Titel
Electro 98. Professional Program Proceedings
Conference_Location
Boston, MA
Print_ISBN
0-7803-4940-7
Type
conf
DOI
10.1109/ELECTR.1998.682105
Filename
682105
Link To Document