DocumentCode :
2183484
Title :
Improving plated copper adhesion for metallisation of glass PCBs
Author :
He, Baofeng ; Webb, Dennis Patrick ; Petzing, Jon ; Leach, Richard
Author_Institution :
Wolfson Sch. of Mech. & Manuf. Eng., Loughborough Univ., Loughborough, UK
fYear :
2011
fDate :
8-11 Aug. 2011
Firstpage :
1
Lastpage :
5
Abstract :
Glass is a promising substitute material for use as a high density substrate for electronic packaging due to its low cost, stability, similar coefficient of thermal expansion to silicon and transparency for optical interconnections. Electroless plating has been applied to deposit conductive tracks on this insulating substrate; therefore improving the plated layer adhesion is one of the most important considerations for development of the technology. Randomly rough surfaces do show improved plating retention compared to smooth untreated glass. However, it seems likely that controlling the surface texture would improve adhesion still further. Many studies have covered the relationship between surface roughness and adhesion performance, but few of them have considered the detail of surface topography in any depth. This paper reports on the use of excimer laser machining to produce controlled texture glass surfaces to improve the adhesion of electroless copper plating for interconnection tracks. As a major tool for the study the textures were characterised using non-contact areal/3D surface topography measurement, coupled with the new ISO 25178 areal surface texture parameters. The areal parameters in principle capture much more of the complexity of surfaces than traditional profile parameters such as Ra. Adhesion of the plated copper was quantified using scratch testing. The development of the experimental techniques for the study is described. From the initial results some potentially useful areal parameters for plating adhesion such as Sal, Str, Sdq and Vw have been identified. Their predictive value needs to be confirmed using statistical hypothesis testing with larger sample batch sizes.
Keywords :
adhesion; copper; electronics packaging; electroplating; excimer lasers; glass; laser beam machining; materials testing; metallisation; printed circuits; rough surfaces; statistical testing; surface roughness; surface texture; surface topography; Cu; ISO 25178; coefficient of thermal expansion; controlled texture glass surfaces; electroless copper plating; electronic packaging; excimer laser machining; glass PCB metallization; high density substrate; insulating substrate; interconnection tracks; noncontact area-3D surface topography measurement; optical interconnections; plated copper adhesion; rough surfaces; scratch testing; statistical hypothesis testing; surface roughness; surface texture parameters; Adhesives; Copper; Glass; Rough surfaces; Surface roughness; Surface topography; Surface treatment;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Packaging Technology and High Density Packaging (ICEPT-HDP), 2011 12th International Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4577-1770-3
Electronic_ISBN :
978-1-4577-1768-0
Type :
conf
DOI :
10.1109/ICEPT.2011.6066836
Filename :
6066836
Link To Document :
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