Title :
Million Atom Electronic Structure and Device Calculations on Peta-Scale Computers
Author :
Lee, Sunhee ; Ryu, Hoon ; Jiang, Zhengping ; Klimeck, Gerhard
Author_Institution :
Network for Comput. Nanotechnol., Purdue Univ., West Lafayette, IN
Abstract :
Semiconductor devices are scaled down to the level which constituent materials are no longer considered continuous. To account for atomistic randomness, surface effects and quantum mechanical effects, an atomistic modeling approach needs to be pursued. The Nanoelectronic Modeling Tool (NEMO 3-D) has satisfied the requirement by including empirical sp3s* and sp3d5s* tight binding models and considering strain to successfully simulate various semiconductor material systems. Computationally, however, NEMO 3-D needs significant improvements to utilize increasing supply of processors. This paper introduces the new modeling tool, OMEN 3-D, and discusses the major computational improvements, the 3-D domain decomposition and the multi-level parallelism. As a featured application, a full 3-D parallelized Schrodinger-Poisson solver and its application to calculate the bandstructure of delta doped phosphorus(P) layer in silicon is demonstrated. Impurity bands due to the donor ion potentials are computed.
Keywords :
Poisson equation; SCF calculations; Schrodinger equation; band structure; elemental semiconductors; impurity states; nanoelectronics; phosphorus; semiconductor device models; silicon; 3-D domain decomposition; 3-D parallelized Schrodinger-Poisson solver; NEMO 3-D modeling; OMEN 3-D modeling tool; Si:P; donor ion potentials; impurity bands; million atom electronic structure calculations; multilevel parallelism; nanoelectronic modeling tool; peta-scale computers; phosphorus doped silicon layer; self-consistent band structure simulation; semiconductor devices; Atomic layer deposition; Capacitive sensors; Computational modeling; Computer networks; Concurrent computing; III-V semiconductor materials; Parallel processing; Quantum mechanics; Semiconductor materials; Silicon;
Conference_Titel :
Computational Electronics, 2009. IWCE '09. 13th International Workshop on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-3925-6
Electronic_ISBN :
978-1-4244-3927-0
DOI :
10.1109/IWCE.2009.5091117