Title :
Probe based antenna measurements up to 325 GHz for upcoming millimeter-wave applications
Author :
Gulan, Heiko ; Beer, Sebastian ; Diebold, Sebastian ; Rusch, Christian ; Leuther, A. ; Kallfass, I. ; Zwick, T.
Author_Institution :
Inst. fur Hochfrequenztech. und Elektron. (IHE), Karlsruhe Inst. of Technol. (KIT), Karlsruhe, Germany
Abstract :
In this paper a probe based measurement setup is presented that allows the characterization of antennas in the frequency-range between 220 GHz and 325 GHz. The radiation pattern, as well as the gain and the return loss of the antenna under test (AUT) can be measured. The limits of the system in terms of accuracy and dynamic range are given. To demonstrate its functionality a 240 GHz patch-antenna on Gallium Arsenide (GaAs) substrate is measured. A comparison between simulation and measurement shows very good agreement.
Keywords :
III-V semiconductors; antenna radiation patterns; gallium arsenide; microstrip antennas; millimetre wave antennas; millimetre wave measurement; AUT; GaAs; antenna under test; frequency 220 GHz to 325 GHz; gallium arsenide substrate; millimeter-wave applications; patch-antenna; probe based antenna measurements; radiation pattern; Antenna measurements; Antenna radiation patterns; Gain; Loss measurement; Probes; Radar antennas; Semiconductor device measurement;
Conference_Titel :
Antenna Technology (iWAT), 2013 International Workshop on
Conference_Location :
Karlsruhe
Print_ISBN :
978-1-4673-2830-2
Electronic_ISBN :
978-1-4673-2829-6
DOI :
10.1109/IWAT.2013.6518338
