DocumentCode :
2183731
Title :
Modeling of Low Concentrated Buffer DNA Detection with Suspend Gate Field-Effect Transistors (SGFET)
Author :
Windbacher, T. ; Sverdlov, V. ; Selberherr, S.
Author_Institution :
Inst. for Microelectron., Tech. Univ. Wien, Vienna
fYear :
2009
fDate :
27-29 May 2009
Firstpage :
1
Lastpage :
4
Abstract :
The experimental data of a suspend gate field-effect transistor (SGFET) have been analyzed with three different models. A SGFET is a MOSFET with an elevated gate and an empty space below it. The exposed gate-oxide layer is bio functionalized with single stranded DNA, which is able to hybridize with a complementary strand. Due to the intrinsic charge of the phosphate groups (minus one elementary charge per group) of the DNA, large shifts in the transfer characteristics are induced. Thus label-free, time-resolved, and in-situ detection of DNA is possible. It can be shown that for buffer concentrations below mmol/1 the Poisson-Boltzmann description it is not valid anymore. Because of the low number of counter ions at small buffer concentrations, the screening of the oligo-deoxynucleotides/DNA is more appropriately described with the Debye-Huckel model. Additionally we propose an extended Poisson-Boltzmann model which takes the closest possible ion distance to the oxide surface into account, and we compare the analytical solution of this model with the Poisson-Boltzmann and the Debye-Huckel model.
Keywords :
Boltzmann equation; Debye-Huckel theory; MOSFET; Poisson equation; field effect transistors; molecular electronics; DNA detection; Debye-Huckel model; MOSFET; Poisson-Boltzmann model; bio functionalized; gate-oxide layer; oligo-deoxynucleotides; phosphate groups; suspend gate field-effect transistors; Biomedical optical imaging; Biosensors; DNA; FETs; MOSFET circuits; Optical buffering; Optical polymers; Probes; Semiconductor process modeling; Stimulated emission;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computational Electronics, 2009. IWCE '09. 13th International Workshop on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-3925-6
Electronic_ISBN :
978-1-4244-3927-0
Type :
conf
DOI :
10.1109/IWCE.2009.5091122
Filename :
5091122
Link To Document :
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